Suppr超能文献

荧光寿命测量的贝叶斯分析方法的开发与测试

Developing and Testing a Bayesian Analysis of Fluorescence Lifetime Measurements.

作者信息

Kaye Bryan, Foster Peter J, Yoo Tae Yeon, Needleman Daniel J

机构信息

John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, MA, United States of America.

FAS Center for Systems Biology, Harvard University, Cambridge, MA, United States of America.

出版信息

PLoS One. 2017 Jan 6;12(1):e0169337. doi: 10.1371/journal.pone.0169337. eCollection 2017.

Abstract

FRET measurements can provide dynamic spatial information on length scales smaller than the diffraction limit of light. Several methods exist to measure FRET between fluorophores, including Fluorescence Lifetime Imaging Microscopy (FLIM), which relies on the reduction of fluorescence lifetime when a fluorophore is undergoing FRET. FLIM measurements take the form of histograms of photon arrival times, containing contributions from a mixed population of fluorophores both undergoing and not undergoing FRET, with the measured distribution being a mixture of exponentials of different lifetimes. Here, we present an analysis method based on Bayesian inference that rigorously takes into account several experimental complications. We test the precision and accuracy of our analysis on controlled experimental data and verify that we can faithfully extract model parameters, both in the low-photon and low-fraction regimes.

摘要

荧光共振能量转移(FRET)测量可以提供小于光衍射极限的长度尺度上的动态空间信息。存在多种测量荧光团之间FRET的方法,包括荧光寿命成像显微镜(FLIM),它依赖于荧光团发生FRET时荧光寿命的缩短。FLIM测量采用光子到达时间直方图的形式,包含正在经历和未经历FRET的荧光团混合群体的贡献,测量分布是不同寿命指数的混合。在这里,我们提出一种基于贝叶斯推理的分析方法,该方法严格考虑了几个实验复杂性。我们在受控实验数据上测试了我们分析的精度和准确性,并验证了我们能够在低光子和低分数区域中忠实地提取模型参数。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce30/5217968/4a117792f5c6/pone.0169337.g001.jpg

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验