Wan Weishi, Yu Lei, Zhu Lin, Yang Xiaodong, Wei Zheng, Liu Jefferson Zhe, Feng Jun, Kunze Kai, Schaff Oliver, Tromp Ruud, Tang Wen-Xin
College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China; Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China.
Ultramicroscopy. 2017 Mar;174:89-96. doi: 10.1016/j.ultramic.2016.12.019. Epub 2016 Dec 27.
We describe the design and commissioning of a novel aberration-corrected low energy electron microscope (AC-LEEM). A third magnetic prism array (MPA) is added to the standard AC-LEEM with two prism arrays, allowing the incorporation of an ultrafast spin-polarized electron source alongside the standard cold field emission electron source, without degrading spatial resolution. The high degree of symmetries of the AC-LEEM are utilized while we design the electron optics of the ultrafast spin-polarized electron source, so as to minimize the deleterious effect of time broadening, while maintaining full control of electron spin. A spatial resolution of 2nm and temporal resolution of 10ps (ps) are expected in the future time resolved aberration-corrected spin-polarized LEEM (TR-AC-SPLEEM). The commissioning of the three-prism AC-LEEM has been successfully finished with the cold field emission source, with a spatial resolution below 2nm.
我们描述了一种新型像差校正低能电子显微镜（AC-LEEM）的设计与调试。在具有两个棱镜阵列的标准AC-LEEM中添加了第三个磁棱镜阵列（MPA），这使得超快自旋极化电子源能够与标准冷场发射电子源一起并入，而不会降低空间分辨率。在设计超快自旋极化电子源的电子光学系统时，我们利用了AC-LEEM的高度对称性，以尽量减少时间展宽的有害影响，同时保持对电子自旋的完全控制。未来的时间分辨像差校正自旋极化低能电子显微镜（TR-AC-SPLEEM）预计空间分辨率为2nm，时间分辨率为10皮秒（ps）。采用冷场发射源的三棱镜AC-LEEM已成功完成调试，空间分辨率低于2nm。
