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优化氧化亚铜薄膜,用作热电触摸探测器。

Optimization of Cuprous Oxides Thin Films to be used as Thermoelectric Touch Detectors.

机构信息

CENIMAT/I3N and UNINOVA, Departamento de Ciência dos Materiais, Faculdade de Ciências e Tecnologia, Universidade NOVA de Lisboa , 2829-516 Lisbon, Portugal.

Department of Micro and Nanosciences, Aalto University , P.O. Box 13500, FI-00076 Aalto, Finland.

出版信息

ACS Appl Mater Interfaces. 2017 Feb 22;9(7):6520-6529. doi: 10.1021/acsami.6b12753. Epub 2017 Feb 8.

Abstract

The electronic and optical properties of p-type copper oxides (CO) strongly depend on the production technique as it influences the obtained phases: cuprous oxide (CuO) or cupric oxide (CuO), the most common ones. Cu films deposited by thermal evaporation have been annealed in air atmosphere, with temperature between 225 and 375 °C and time between 1 and 4 h. The resultant CO films have been studied to understand the influence of processing parameters in the thermoelectric, electrical, optical, morphological, and structural properties. Films with a CuO single phase are formed when annealing at 225 °C, while CuO single phase films can be obtained at 375 °C. In between, both phases are obtained in proportions that depend on the film thickness and annealing time. The positive sign of the Seebeck coefficient (S), measured at room temperature (RT), confirms the p-type behavior of both oxides, showing values up to 1.2 mV·°C and conductivity up to 2.9 (Ω·m). A simple detector using CuO have been fabricated and tested with fast finger touch events.

摘要

p 型铜氧化物 (CO) 的电子和光学性质强烈依赖于生产工艺,因为它会影响到所获得的相:氧化亚铜 (CuO) 或氧化铜 (CuO),这是最常见的两种相。通过热蒸发沉积的 Cu 薄膜在空气氛围中进行退火,温度在 225 到 375°C 之间,时间在 1 到 4 小时之间。研究所得的 CO 薄膜,以了解处理参数对热电、电学、光学、形态和结构性能的影响。在 225°C 退火时形成 CuO 单相薄膜,而在 375°C 退火时可以得到 CuO 单相薄膜。在这两者之间,可以获得取决于薄膜厚度和退火时间的两种相的比例。在室温下测量的塞贝克系数 (S) 的正值证实了两种氧化物的 p 型行为,其值高达 1.2 mV·°C,电导率高达 2.9 (Ω·m)。使用 CuO 制造了一个简单的探测器,并对其进行了快速手指触摸事件的测试。

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