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化学气相沉积法在 Si/SiO 上直接大面积制备自终止限制的单层石墨烯。

Self-Terminating Confinement Approach for Large-Area Uniform Monolayer Graphene Directly over Si/SiO by Chemical Vapor Deposition.

机构信息

IFW-Dresden , Helmholtz Strasse 20, D-01171 Dresden, Germany.

Centre of Polymer and Carbon Materials, Polish Academy of Sciences , ul. M. Curie-Sklodowskiej 34, Zabrze, PL-41-819 Zabrze, Poland.

出版信息

ACS Nano. 2017 Feb 28;11(2):1946-1956. doi: 10.1021/acsnano.6b08069. Epub 2017 Jan 26.

DOI:10.1021/acsnano.6b08069
PMID:28117971
Abstract

To synthesize graphene by chemical vapor deposition (CVD) both in large area and with uniform layer number directly over Si/SiO has proven challenging. The use of catalytically active metal substrates, in particular Cu, has shown far greater success and therefore is popular. That said, for electronics applications it requires a transfer procedure, which tends to damage and contaminate the graphene. Thus, the direct fabrication of uniform graphene on Si/SiO remains attractive. Here we show a facile confinement CVD approach in which we simply "sandwich" two Si wafers with their oxide faces in contact to form uniform monolayer graphene. A thorough examination of the material reveals it comprises faceted grains despite initially nucleating as round islands. Upon clustering, they facet to minimize their energy. This behavior leads to faceting in polygons, as the system aims to ideally form hexagons, the lowest energy form, much like the hexagonal cells in a beehive, which requires the minimum wax. This process also leads to a near minimal total grain boundary length per unit area. This fact, along with the high graphene quality, is reflected in its electrical performance, which is highly comparable with graphene formed over other substrates, including Cu. In addition, the graphene growth is self-terminating. Our CVD approach is easily scalable and will make graphene formation directly on Si wafers competitive against that from metal substrates, which suffer from transfer. Moreover, this CVD route should be applicable for the direct synthesis of other 2D materials and their van der Waals heterostructures.

摘要

通过化学气相沉积(CVD)在 Si/SiO 上直接大面积合成具有均匀层数的石墨烯一直具有挑战性。使用催化活性金属衬底,特别是 Cu,已经取得了更大的成功,因此很受欢迎。也就是说,对于电子应用,它需要一个转移过程,这往往会损坏和污染石墨烯。因此,直接在 Si/SiO 上制造均匀的石墨烯仍然具有吸引力。在这里,我们展示了一种简单的限制 CVD 方法,我们只需将两个 Si 晶片及其氧化物面接触“夹”在一起,即可形成均匀的单层石墨烯。对材料的彻底检查表明,尽管最初是作为圆形岛状核来生长,但它仍然由具有多面体形貌的晶粒组成。在团聚过程中,它们会多面体形貌以最小化其能量。这种行为会导致在多边形中出现多面体形貌,因为系统旨在理想地形成六边形,这是最低能量的形式,就像蜂巢中的六边形细胞一样,这需要最少的蜡。这个过程也导致了单位面积上的总晶界长度接近最小。这一事实以及高石墨烯质量反映在其电性能上,其性能与在其他衬底(包括 Cu)上形成的石墨烯高度可比。此外,石墨烯的生长是自终止的。我们的 CVD 方法易于扩展,并且将使石墨烯在 Si 晶片上的直接形成与金属衬底上的形成具有竞争力,因为金属衬底在转移过程中会遭受损失。此外,这种 CVD 途径应该适用于其他二维材料及其范德华异质结构的直接合成。

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