Téllez-Quiñones Alejandro, Malacara-Doblado Daniel, Malacara-Hernández Zacarias, Gutiérrez-Hernández David A, Malacara-Hernández Daniel
Appl Opt. 2017 Feb 1;56(4):1215-1224. doi: 10.1364/AO.56.001215.
In a previous work, we introduced the concept of transversal aberrations {U,V} calculated at arbitrary Hartmann-plane distances z=r [Appl. Opt.55, 2160 (2016)APOPAI1559-128X10.1364/AO.55.002160]. These transversal aberrations can be used to estimate the wave aberration function W, as well as the classical transversal aberrations {X,Y} calculated at a theoretical plane z=f, where f is the radius of a reference semisphere. However, when the ray identification is difficult to achieve at z=f, the use of {U,V} can be of great help. In the context of a least-squares fitting of the Hartmann data, the use of {U,V} is proposed by analyzing some simple examples for the case of a W with aberration terms up to the third order. These examples also consider the hypothesis f≫W, as presented in the majority of the optical applications.
在之前的一项工作中，我们引入了在任意哈特曼平面距离z = r处计算的横向像差{U, V}的概念[《应用光学》55, 2160 (2016年)，APOPAI 1559 - 128X 10.1364/AO.55.002160]。这些横向像差可用于估计波像差函数W，以及在理论平面z = f处计算的经典横向像差{X, Y}，其中f是参考半球的半径。然而，当在z = f处难以实现光线识别时，{U, V}的使用会有很大帮助。在哈特曼数据的最小二乘拟合背景下，通过分析一些像差项高达三阶的W的简单示例，提出了{U, V}的使用方法。这些示例还考虑了大多数光学应用中呈现的f≫W的假设。
