The State Key Laboratory of Robotics and Systems, Harbin Institute of Technology , Harbin 150080, PR China.
Langmuir. 2017 Mar 21;33(11):2725-2733. doi: 10.1021/acs.langmuir.6b04572. Epub 2017 Mar 13.
We report high-resolution multiparametric kelvin probe force microscopy (MP-KPFM) measurements for the simultaneous quantitative mapping of the contact potential difference (CPD) and nanomechanical properties of the sample in single-pass mode. This method combines functionalities of the force-distance-based atomic force microscopy and amplitude-modulation (AM) KPFM to perform measurements in single-pass mode. During the tip-sample approach-and-retract cycle, nanomechanical measurements are performed for the retract part of nanoindentation, and the CPD is measured by the lifted probe with a constant tip-sample distance. We compare the performance of the proposed method with the conventional KPFMs by mapping the CPD of multilayer graphene deposited on n-doped silicon, and the results demonstrate that MP-KPFM has comparable performance to AM-KPFM. In addition, the experimental results of a custom-fabricated polymer grating with heterogeneous surfaces validate the multiparametric imaging capability of the MP-KPFM. This method can have potential applications in finding the inherent link between nanomechanical properties and the surface potential of the materials, such as the quantification of the electromechanical response of the deformed piezoelectric materials.
我们报告了用于在单次通过模式下同时定量映射样品的接触电势差 (CPD) 和纳米力学性质的高分辨率多参数 Kelvin 探针力显微镜 (MP-KPFM) 测量。该方法结合了基于力距的原子力显微镜和振幅调制 (AM) KPFM 的功能，以在单次通过模式下执行测量。在针尖-样品接近-后退循环中，纳米力学测量在纳米压痕的后退部分进行，而 CPD 通过具有恒定针尖-样品距离的提升探针进行测量。我们通过映射沉积在 n 型掺杂硅上的多层石墨烯的 CPD，比较了提出的方法与传统 KPFM 的性能，结果表明 MP-KPFM 具有与 AM-KPFM 相当的性能。此外，具有异质表面的定制聚合物光栅的实验结果验证了 MP-KPFM 的多参数成像能力。这种方法在发现材料的纳米力学性质和表面电势之间的固有联系方面具有潜在的应用，例如量化变形压电材料的机电响应。
