Breen Andrew J, Babinsky Katharina, Day Alec C, Eder K, Oakman Connor J, Trimby Patrick W, Primig Sophie, Cairney Julie M, Ringer Simon P
1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
3Department of Physical Metallurgy and Materials Testing,Montanuniversität Leoben,Franz-Josef Straße 18,8700 Leoben,Austria.
Microsc Microanal. 2017 Apr;23(2):279-290. doi: 10.1017/S1431927616012605. Epub 2017 Mar 14.
Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al-0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7° and 1.4°, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.
相关显微镜方法为许多研究问题提供了协同解决方案。一种研究较少的组合是在同一尖端样品上使用原子探针断层扫描（APT）和透射菊池衍射（TKD）。通过结合这两种强大的显微镜技术，可以更详细地研究重要工程合金的微观结构。首次将使用TKD独立验证使用APT进行的晶体学测量的准确性。将比较来自两个原子探针尖端的实验数据，一个是在直飞路径原子探针上收集的纳米晶Al-0.5Ag合金样品，另一个是在配备反射镜的仪器上收集的高纯度Mo样品。我们发现，根据两种不同极组合的校准原子探针重建计算出的平均最小取向差角分别与TKD结果相差0.7°和1.4°。原子探针的类型和实验条件似乎对这种准确性有一定影响，并且重建和测量程序可能会进一步导致角分辨率下降。还将讨论这种相关方法的挑战和影响。
