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基于光子计数技术并校正X射线光谱中束硬化效应的精确材料识别方法。

Precise material identification method based on a photon counting technique with correction of the beam hardening effect in X-ray spectra.

作者信息

Kimoto Natsumi, Hayashi Hiroaki, Asahara Takashi, Mihara Yoshiki, Kanazawa Yuki, Yamakawa Tsutomu, Yamamoto Shuichiro, Yamasaki Masashi, Okada Masahiro

机构信息

Graduate School of Health Sciences, Tokushima University, 3-18-15 Kuramoto-cho, Tokushima 770-8503, Japan.

Graduate School of Biomedical Sciences, Tokushima University, 3-18-15 Kuramoto-cho, Tokushima 770-8503, Japan.

出版信息

Appl Radiat Isot. 2017 Jun;124:16-26. doi: 10.1016/j.apradiso.2017.01.049. Epub 2017 Mar 9.

DOI:10.1016/j.apradiso.2017.01.049
PMID:28314161
Abstract

The aim of our study is to develop a novel material identification method based on a photon counting technique, in which the incident and penetrating X-ray spectra are analyzed. Dividing a 40 kV X-ray spectra into two energy regions, the corresponding linear attenuation coefficients are derived. We can identify the materials precisely using the relationship between atomic number and linear attenuation coefficient through the correction of the beam hardening effect of the X-ray spectra.

摘要

我们研究的目的是基于光子计数技术开发一种新型材料识别方法,其中会对入射和穿透的X射线光谱进行分析。将40 kV的X射线光谱划分为两个能量区域,得出相应的线性衰减系数。通过对X射线光谱的束硬化效应进行校正,我们可以利用原子序数与线性衰减系数之间的关系精确识别材料。

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Appl Radiat Isot. 2017 Jun;124:16-26. doi: 10.1016/j.apradiso.2017.01.049. Epub 2017 Mar 9.
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