U.S. Food and Drug Administration, 10903 New Hampshire Avenue, White Oak Building 62 Room 1131, Silver Spring, MD, 20993, USA.
Biomed Eng Online. 2017 Mar 20;16(1):33. doi: 10.1186/s12938-017-0328-9.
There have been concerns that Electromagnetic security systems such as walk-through metal detectors (WTMDs) can potentially cause electromagnetic interference (EMI) in certain active medical devices including implantable cardiac pacemakers and implantable neurostimulators. Incidents of EMI between WTMDs and active medical devices also known as personal medical electronic devices (PMED) continue to be reported. This paper reports on emission measurements of sample WTMDs and testing of 20 PMEDs in a WTMD simulation system.
Magnetic fields from sample WTMD systems were characterized for emissions and exposure of certain PMEDs. A WTMD simulator system designed and evaluated by FDA in previous studies was used to mimic the PMED exposures to the waveform from sample WTMDs. The simulation system allows for controlled PMED exposure enabling careful study with adjustable magnetic field strengths and exposure duration, and provides flexibility for PMED exposure at elevated levels in order to study EMI effects on the PMED. The PMED samples consisted of six implantable cardiac pacemakers, six implantable cardioverter defibrillators (ICD), five implantable neurostimulators, and three insulin pumps. Each PMED was exposed in the simulator to the sample WTMD waveforms using methods based on appropriate consensus test standards for each of the device type.
Testing the sample PMEDs using the WTMD simulator revealed EMI effects on two implantable pacemakers and one implantable neurostimulator for exposure field strength comparable to actual WTMD field strength. The observed effects were transient and the PMEDs returned to pre-exposure operation within a few seconds after removal from the simulated WTMD exposure fields. No EMI was observed for the sample ICDs or insulin pumps.
The findings are consistent with earlier studies where certain sample PMEDs exhibited EMI effects. Clinical implications were not addressed in this study. Additional studies are needed to evaluate potential PMED EMI susceptibilities over a broader range of security systems.
人们一直担心,电磁安全系统(如金属探测器)可能会对某些有源医疗设备(包括植入式心脏起搏器和植入式神经刺激器)产生电磁干扰(EMI)。金属探测器和有源医疗设备(也称为个人医疗电子设备,PMED)之间的 EMI 事件仍在不断报告。本文报告了对样本金属探测器的发射测量和在金属探测器模拟系统中对 20 个 PMED 的测试结果。
对样本金属探测器系统的磁场进行了特征描述,以了解某些 PMED 的发射和暴露情况。之前的研究中,FDA 设计和评估了一种金属探测器模拟系统,用于模拟 PMED 对样本金属探测器波形的暴露。该模拟系统允许对 PMED 进行受控暴露,可以通过可调磁场强度和暴露持续时间仔细研究,并且为在升高的水平下对 PMED 进行暴露提供了灵活性,以研究 EMI 对 PMED 的影响。PMED 样本包括 6 个植入式心脏起搏器、6 个植入式心律转复除颤器(ICD)、5 个植入式神经刺激器和 3 个胰岛素泵。每个 PMED 都在模拟器中使用针对每种设备类型的适当共识测试标准的方法,对样本金属探测器波形进行了暴露。
使用金属探测器模拟器对样本 PMED 进行测试,结果显示在与实际金属探测器场强相当的场强下,有两个植入式起搏器和一个植入式神经刺激器受到 EMI 影响。观察到的影响是瞬态的,PMED 在从模拟金属探测器暴露场移除后几秒钟内即可恢复到暴露前的操作。对于样本 ICD 或胰岛素泵,未观察到 EMI。
这些发现与之前的研究结果一致,即某些样本 PMED 表现出 EMI 效应。本研究未涉及临床意义。需要进行更多研究,以评估更广泛的安全系统中潜在的 PMED EMI 易感性。