Department of Chemistry, KU Leuven-University of Leuven , Celestijnenlaan 200F, 3001 Heverlee, Belgium.
Anal Chem. 2017 Apr 18;89(8):4595-4603. doi: 10.1021/acs.analchem.7b00097. Epub 2017 Apr 6.
Total reflection X-ray fluorescence (TXRF) is becoming more and more popular for elemental analysis in academia and industry. However, simplification of the procedures for analyzing samples with complex compositions and residual matrix effects is still needed. In this work, the effect of an inorganic (CaCl) and an organic (tetraalkylphosphonium chloride) matrix on metals quantification by TXRF was investigated for liquid samples. The samples were spiked with up to 20 metals at concentrations ranging from 3 to 50 mg L per element, including elements with spectral peaks near the peaks of the matrix elements or near the Raleigh and Compton scattering peaks of the X-ray source (molybdenum anode). The recovery rate (RR) and the relative standard deviation (RSD) were calculated to express the accuracy and the precision of the measured element concentrations. In samples with no matrix effects, good RRs are obtained regardless of the internal standard selected. However, in samples with moderate matrix content, the use of an optimum internal standard (OIS) at a concentration close to that of the analyte significantly improved the quantitative analysis. In samples with high concentrations of inorganic ions, using a Triton X-100 aqueous solution to dilute the sample during the internal standardization resulted in better RRs and lower RSDs compared to using only water. In samples with a high concentration of organic material, pure ethanol gave slightly better results than when a Triton X-100-ethanol solution was used for dilution. Compared to previous methods reported in the literature, the new sample-preparation method gave better accuracy, precision, and sensitivity for the elements tested. Sample dilution with an OIS and the surfactant Triton X-100 (inorganic media) or ethanol (organic media) is recommended for fast routine elemental determination in matrix containing samples, as it does not require special equipment, experimentally derived case-dependent mathematical corrections, or physicochemical removal of interfering elements.
全反射 X 射线荧光(TXRF)技术在学术和工业领域中越来越受欢迎,用于元素分析。然而,对于分析组成复杂和存在残留基质效应的样品,仍需要简化分析程序。本工作研究了无机(氯化钙)和有机(四烷基卤化鏻)基质对液体样品中金属定量分析的影响。在样品中加入高达 20 种金属,浓度范围为每个元素 3 至 50mg/L,包括与基质元素峰或 X 射线源(钼阳极)的 Raleigh 和 Compton 散射峰接近的谱峰的元素。通过计算回收率(RR)和相对标准偏差(RSD)来表示测量元素浓度的准确性和精密度。在无基质效应的样品中,无论选择哪种内标,都可以获得良好的 RR。然而,在基质含量适中的样品中,使用浓度接近分析物的最佳内标(OIS)可以显著提高定量分析的准确性。在含有高浓度无机离子的样品中,与仅使用水相比,在进行内标化时使用 Triton X-100 水溶液稀释样品可以获得更好的 RR 和更低的 RSD。在含有高浓度有机物质的样品中,与使用 Triton X-100-乙醇溶液稀释相比,纯乙醇的结果略好。与文献中报道的先前方法相比,新的样品制备方法为测试元素提供了更好的准确性、精密度和灵敏度。推荐使用 OIS 和表面活性剂 Triton X-100(无机介质)或乙醇(有机介质)稀释样品,用于基质含量高的样品中快速常规元素测定,因为它不需要特殊设备、基于实验推导的依赖于具体情况的数学校正,或物理化学去除干扰元素。