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频率对贫铀表面Ti/TiN多层膜微动磨损行为的影响

Effect of frequency on fretting wear behavior of Ti/TiN multilayer film on depleted uranium.

作者信息

Wu Yan-Ping, Li Zheng-Yang, Zhu Sheng-Fa, Lu Lei, Cai Zhen-Bing

机构信息

Institute of Materials, China Academy of Engineering Physics, Jiangyou, Sichuan, PR China.

Tribology Research Institute, Key Lab of Advanced Technologies of Materials, Southwest Jiaotong University, Chengdu, China.

出版信息

PLoS One. 2017 Apr 6;12(4):e0175084. doi: 10.1371/journal.pone.0175084. eCollection 2017.

DOI:10.1371/journal.pone.0175084
PMID:28384200
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC5383101/
Abstract

The Ti/TiN multi-layer film was prepared on the depleted uranium (DU) substrate by cathodic arc ion plating equipment. The character of multi-layer film was studied by SEM, XRD and AES, revealed that the surface was composed of small compact particle and the cross-section had a multi-layer structure. The fretting wear performance under different frequencies was performed by a MFT-6000 machine with a ball-on-plate configuration. The wear morphology was analyzed by white light interferometer, OM and SEM with an EDX. The result shows the Ti/TiN multi-layer film could greatly improve the fretting wear performance compared to the DU substrate. The fretting wear running and damaged behavior are strongly dependent on the film and test frequency. The fretting region of DU substrate and Ti/TiN multi-layer under low test frequency is gross slip. With the increase of test frequency, the fretting region of Ti/TiN multi-layer change from gross slip to mixed fretting, then to partial slip.

摘要

采用阴极电弧离子镀设备在贫铀(DU)基体上制备了Ti/TiN多层膜。利用扫描电子显微镜(SEM)、X射线衍射仪(XRD)和俄歇电子能谱仪(AES)对多层膜的特性进行了研究,结果表明其表面由细小致密颗粒组成,且截面具有多层结构。采用MFT - 6000型销 - 盘式摩擦磨损试验机对不同频率下的微动磨损性能进行了测试。利用白光干涉仪、光学显微镜(OM)和配备能谱仪(EDX)的扫描电子显微镜对磨损形貌进行了分析。结果表明,与DU基体相比,Ti/TiN多层膜能显著提高微动磨损性能。微动磨损的运行和损伤行为强烈依赖于薄膜和测试频率。在低测试频率下,DU基体和Ti/TiN多层膜的微动区域均为严重滑动。随着测试频率的增加,Ti/TiN多层膜的微动区域从严重滑动转变为混合微动,然后再转变为部分滑动。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/19d68162140d/pone.0175084.g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/f41cb6c1c47b/pone.0175084.g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/31ec87fe2a64/pone.0175084.g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/4568cefc8b09/pone.0175084.g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/0ff1ac5354a6/pone.0175084.g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/1b042cb446a6/pone.0175084.g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/267c3fda9de8/pone.0175084.g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/2f9d17aded54/pone.0175084.g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/ed6588e6e7cc/pone.0175084.g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/19d68162140d/pone.0175084.g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/f41cb6c1c47b/pone.0175084.g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/31ec87fe2a64/pone.0175084.g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/4568cefc8b09/pone.0175084.g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/0ff1ac5354a6/pone.0175084.g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/1b042cb446a6/pone.0175084.g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/267c3fda9de8/pone.0175084.g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/2f9d17aded54/pone.0175084.g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/ed6588e6e7cc/pone.0175084.g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f31/5383101/19d68162140d/pone.0175084.g009.jpg

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