National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE) and The State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China.
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, D-52425 Jülich, Germany.
Nat Commun. 2017 May 15;8:15348. doi: 10.1038/ncomms15348.
Electron energy-loss magnetic chiral dichroism is a powerful technique that allows the local magnetic properties of materials to be measured quantitatively with close-to-atomic spatial resolution and element specificity in the transmission electron microscope. Until now, the technique has been restricted to measurements of the magnetic circular dichroism signal in the electron beam direction. However, the intrinsic magnetization directions of thin samples are often oriented in the specimen plane, especially when they are examined in magnetic-field-free conditions in the transmission electron microscope. Here, we introduce an approach that allows in-plane magnetic signals to be measured using electron magnetic chiral dichroism by selecting a specific diffraction geometry. We compare experimental results recorded from a cobalt nanoplate with simulations to demonstrate that an electron magnetic chiral dichroism signal originating from in-plane magnetization can be detected successfully.
电子能量损失磁手性二向色性是一种强大的技术，它允许用接近原子空间分辨率和透射电子显微镜中的元素特异性来定量测量材料的局部磁性。到目前为止，该技术仅限于测量电子束方向的磁圆二色性信号。然而，薄样品的固有磁化方向通常在样品平面内取向，特别是当它们在透射电子显微镜中无磁场条件下进行检查时。在这里，我们引入了一种方法，通过选择特定的衍射几何形状，可以使用电子磁手性二向色性来测量面内磁信号。我们将从钴纳米板记录的实验结果与模拟结果进行比较，以证明可以成功地检测到源自面内磁化的电子磁手性二向色性信号。
