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利用微波增强源内衰减微波等离子体炬质谱法快速测定固体制剂中的成分。

Fast Determination of Ingredients in Solid Pharmaceuticals by Microwave-Enhanced In-Source Decay of Microwave Plasma Torch Mass Spectrometry.

机构信息

Department of Chemistry, Jilin University, Changchun, 130012, China.

Changchun University of Chinese Medicine, Changchun, 130117, China.

出版信息

J Am Soc Mass Spectrom. 2017 Sep;28(9):1947-1957. doi: 10.1007/s13361-017-1708-x. Epub 2017 Jun 19.

Abstract

Rapid qualitative and quantitative analysis of solid samples (e.g., pharmaceutical preparations) by using a small and low-resolution mass spectrometer without MS/MS function is still a challenge in ambient pressure ionization mass spectrometric analysis. Herein, a practically efficient method termed microwave-enhanced in-source decay (MEISD) using microwave plasma torch desorption ionization coupled with time-of-flight mass spectrometry (MPTDI-TOF MS) was developed for fast analysis of pharmaceutical tablets using a miniature TOF mass spectrometer without tandem mass function. The intensity of ISD fragmentation was evaluated under different microwave power values. Several factors, including desorption distance and time that might affect the signal intensity and fragmentation, were systematically investigated. It was observed that both the protonated molecular ions and major fragment ions from the active ingredients in tablets could be found in the full-scan mass spectra in positive ion mode, which were comparable to those obtained by a commercial LTQ-XL ion trap mass spectrometer. The structures of the ingredients could be elucidated in detail using the MEISD method, which promotes our understanding of the desorption/ionization processes in microwave plasma torch (MPT). Quantitative analysis of 10 tablets was achieved by full-scan MPTDI-TOF MS with low limit of detection (LOD, 0.763 mg/g), acceptable relative standard deviation (RSD < 7.33%, n =10), and 10 s for each tablet, showing promising applications in high throughput screening of counterfeit drugs. Graphical Abstract ᅟ.

摘要

利用小型低分辨率质谱仪对固体样品(例如药物制剂)进行快速定性和定量分析,而无需 MS/MS 功能,这在常压电离质谱分析中仍然是一个挑战。在此,开发了一种实用有效的方法,称为微波增强源内衰减(MEISD),使用微波等离子体炬解吸电离与飞行时间质谱(MPTDI-TOF MS)联用,对使用无串联质谱功能的微型 TOF 质谱仪快速分析药片。评估了在不同微波功率值下的 ISD 碎裂强度。系统研究了可能影响信号强度和碎裂的几个因素,包括解吸距离和时间。观察到在正离子模式下,在全扫描质谱中可以找到来自片剂中活性成分的质子化分子离子和主要碎片离子,这与从商业 LTQ-XL 离子阱质谱仪获得的结果相当。可以使用 MEISD 方法详细阐明成分的结构,从而促进我们对微波等离子体炬(MPT)中的解吸/电离过程的理解。通过全扫描 MPTDI-TOF MS 对 10 片进行定量分析,检测限(LOD,0.763 mg/g)低,相对标准偏差(RSD <7.33%,n=10)可接受,每个片剂的分析时间为 10 s,有望在假药高通量筛选中得到应用。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fb18/5556135/05439a2bb854/13361_2017_1708_Figa_HTML.jpg

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