Hou Xiang, Cheng Xue-Feng, Xiao Xin, He Jing-Hui, Xu Qing-Feng, Li Hua, Li Na-Jun, Chen Dong-Yun, Lu Jian-Mei
College of Chemistry, Chemical Engineering and Materials Science, Collaborative Innovation Center of Suzhou Nano Science and Technology Institution, Soochow University, Suzhou, 215123, China.
Chem Asian J. 2017 Sep 5;12(17):2278-2283. doi: 10.1002/asia.201700706. Epub 2017 Aug 9.
Organic multilevel random resistive access memory (RRAM) devices with an electrode/organic layer/electrode sandwich-like structure suffer from poor reproducibility, such as low effective ternary device yields and a wide threshold voltage distribution, and improvements through organic material renovation are rather limited. In contrast, engineering of the electrode surfaces rather than molecule design has been demonstrated to boost the performance of organic electronics effectively. Herein, we introduce surface engineering into organic multilevel RRAMs to enhance their ternary memory performance. A new asymmetric conjugated molecule composed of phenothiazine and malononitrile with a side chain (PTZ-PTZO-CN) was fabricated in an indium tin oxide (ITO)/PTZ-PTZO-CN/Al sandwich-like memory device. Modification of the ITO substrate with a phosphonic acid (PA) prior to device fabrication increased the ternary device yield (the ratio of effective ternary device) and narrowed the threshold voltage distribution. The crystallinity analysis revealed that PTZ-PTZO-CN grown on untreated ITO crystallized into two phases. After the surface engineering of ITO, this crystalline ambiguity was eliminated and a sole crystal phase was obtained that was the same as in the powder state. The unified crystal structure and improved grain mosaicity resulted in a lower threshold voltage and, therefore, a higher ternary device yield. Our result demonstrated that PA modification also improved the memory performance of an asymmetric conjugated molecule with a side chain.
具有电极/有机层/电极三明治结构的有机多层随机电阻式存取存储器(RRAM)器件存在再现性差的问题,如有效的三值器件良率低和阈值电压分布宽,通过有机材料革新来改善的效果相当有限。相比之下,已证明对电极表面进行工程设计而非分子设计能有效提升有机电子器件的性能。在此,我们将表面工程引入有机多层RRAM中以增强其三值存储性能。在氧化铟锡(ITO)/PTZ-PTZO-CN/Al三明治式存储器件中制备了一种由吩噻嗪和带有侧链的丙二腈组成的新型不对称共轭分子(PTZ-PTZO-CN)。在器件制备前用膦酸(PA)对ITO衬底进行修饰,提高了三值器件良率(有效三值器件的比例)并缩小了阈值电压分布。结晶度分析表明,在未处理的ITO上生长的PTZ-PTZO-CN结晶为两个相。对ITO进行表面工程处理后,消除了这种结晶模糊性,得到了与粉末状态相同的单一晶相。统一的晶体结构和改善的晶粒镶嵌性导致阈值电压降低,从而提高了三值器件良率。我们的结果表明,PA修饰还改善了带有侧链的不对称共轭分子的存储性能。