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用于高性能三元电阻式存储器的伪卤化物诱导二维(CH₃NH₃)PbI₃₋ₓ(SCN)ₓ钙钛矿

Pseudohalide-Induced 2D (CH NH ) PbI (SCN) Perovskite for Ternary Resistive Memory with High Performance.

作者信息

Cheng Xue-Feng, Hou Xiang, Zhou Jin, Gao Bi-Jun, He Jing-Hui, Li Hua, Xu Qing-Feng, Li Na-Jun, Chen Dong-Yun, Lu Jian-Mei

机构信息

College of Chemistry, Chemical Engineering and Materials Science, Collaborative Innovation Center of Suzhou Nano Science and Technology, National United Engineering Laboratory of Functionalized Environmental Adsorption Materials, Soochow University, Suzhou, 215123, P. R. China.

出版信息

Small. 2018 Mar;14(12):e1703667. doi: 10.1002/smll.201703667. Epub 2018 Feb 19.

Abstract

Recently, organic-inorganic hybrid perovskites (OIHP) are studied in memory devices, but ternary resistive memory with three states based on OIHP is not achieved yet. In this work, ternary resistive memory based on hybrid perovskite is achieved with a high device yield (75%), much higher than most organic ternary resistive memories. The pseudohalide-induced 2D (CH NH ) PbI (SCN) perovskite thin film is prepared by using a one-step solution method and fabricated into Al/perovskite film/indium-tin oxide (glass substrate as well as flexible polyethylene terephthalate substrate) random resistive access memory (RRAM) devices. The three states have a conductivity ratio of 1:10 :10 , long retention over 10 000 s, and good endurance properties. The electrode area variation, impedance test, and current-voltage plotting show that the two resistance switches are attributable to the charge trap filling due to the effect of unscreened defect in 2D nanosheets and the formation of conductive filaments, respectively. This work paves way for stable perovskite multilevel RRAMs in ambient atmosphere.

摘要

最近,有机-无机杂化钙钛矿(OIHP)被用于存储器器件的研究,但基于OIHP的具有三种状态的三元电阻式存储器尚未实现。在这项工作中,基于杂化钙钛矿的三元电阻式存储器得以实现,器件良品率高达75%,远高于大多数有机三元电阻式存储器。采用一步溶液法制备了拟卤化物诱导的二维(CH₃NH₃)PbI₂(SCN)钙钛矿薄膜,并将其制成Al/钙钛矿薄膜/氧化铟锡(玻璃基板以及柔性聚对苯二甲酸乙二酯基板)随机电阻存取存储器(RRAM)器件。这三种状态的电导率比为1:10⁻²:10⁻⁴,保持时间长达10000秒以上,且具有良好的耐久性。电极面积变化、阻抗测试和电流-电压绘图表明,这两种电阻开关分别归因于二维纳米片中未屏蔽缺陷效应导致的电荷陷阱填充和导电细丝的形成。这项工作为在环境大气中实现稳定的钙钛矿多级RRAM铺平了道路。

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