Department of Physics, University of California, Berkeley, California 94720, USA.
Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA-Nanociencia), 28049 Madrid, Spain.
Nat Commun. 2017 Jul 6;8:15995. doi: 10.1038/ncomms15995.
The circular photogalvanic effect (CPGE) is the part of a photocurrent that switches depending on the sense of circular polarization of the incident light. It has been consistently observed in systems without inversion symmetry and depends on non-universal material details. Here we find that in a class of Weyl semimetals (for example, SrSi) and three-dimensional Rashba materials (for example, doped Te) without inversion and mirror symmetries, the injection contribution to the CPGE trace is effectively quantized in terms of the fundamental constants e, h, c and with no material-dependent parameters. This is so because the CPGE directly measures the topological charge of Weyl points, and non-quantized corrections from disorder and additional bands can be small over a significant range of incident frequencies. Moreover, the magnitude of the CPGE induced by a Weyl node is relatively large, which enables the direct detection of the monopole charge with current techniques.
圆光电效应(CPGE)是光电流的一部分,它取决于入射光的圆偏振方向。在没有反转对称性的系统中,已经观察到了圆光电效应,它取决于非普遍的材料细节。在这里,我们发现,在一类外尔半金属(例如 SrSi)和三维 Rashba 材料(例如掺杂 Te)中,没有反转和镜像对称性,CPGE 迹线的注入贡献可以用基本常数 e、h、c 有效地量子化,而没有材料相关的参数。这是因为 CPGE 直接测量了 Weyl 点的拓扑电荷,而无序和附加能带的非量子化修正在很大的入射频率范围内可能很小。此外,Weyl 节点引起的 CPGE 幅度相对较大,这使得利用当前技术可以直接检测磁单极子电荷。