Key Laboratory of Materials Physics, Anhui Key Laboratory of Nanomaterials and Nanostructures, Institute of Solid State Physics, Hefei Institutes of Physical Science, Chinese Academy of Sciences , Hefei 230031, P.R. China.
School of Chemistry and Materials Science, University of Science and Technology of China , Hefei 230031, P.R. China.
ACS Appl Mater Interfaces. 2017 Aug 30;9(34):28737-28742. doi: 10.1021/acsami.7b06058. Epub 2017 Aug 18.
The ultraviolet (UV) photodetectors have significant applications different fields. High detectivity, high responsivity and wide active area are required to probe a weak UV light in actual ambient. Unfortunately, most practical UV photoconductors based on wide bandgap semiconductor films can hardly have both a high responsivity and a low dark current density. In this study, the intermediate band engineering in semiconductor has been proposed try to solve this problem. The intermediate band UV photodetectors based on BiSnO (0.017 < x < 0.041) films show a detectivity of 6.1 × 10 Jones at 280 nm and a quantum efficiency of 2.9 × 10 %. The dynamic range is 195 dB, which is much higher than other UV photodetector. The recovery time is about 1 s after exposing device into ethanol steam. Our results demonstrate that the intermediate band semiconductor BiSnO films can serve as a high performance UV photodetector.
紫外(UV)光电探测器在不同领域有重要应用。为了在实际环境中探测微弱的紫外光,需要高探测率、高响应率和宽的有源区。不幸的是,大多数基于宽带隙半导体薄膜的实用紫外光电导器很难同时具有高响应率和低暗电流密度。在这项研究中,已经提出了半导体中的中间能带工程来尝试解决这个问题。基于 BiSnO(0.017 < x < 0.041)薄膜的中间能带 UV 光电探测器在 280nm 处的探测率为 6.1×10 Jones,量子效率为 2.9×10%。动态范围为 195dB,远高于其他 UV 光电探测器。将器件暴露于乙醇蒸汽中后,恢复时间约为 1s。我们的结果表明,中间能带半导体 BiSnO 薄膜可用作高性能的 UV 光电探测器。