Mueller Inka, Fritzen Claus-Peter
Department of Mechanical Engineering, University of Siegen, Paul-Bonatz-Str., 9-11, 57076 Siegen, Germany.
Materials (Basel). 2017 Jan 16;10(1):71. doi: 10.3390/ma10010071.
The use of piezoelectric wafer active sensors (PWAS) for structural health monitoring (SHM) purposes is state of the art for acousto-ultrasonic-based methods. For system reliability, detailed information about the PWAS itself is necessary. This paper gives an overview on frequent PWAS faults and presents the effects of these faults on the wave propagation, used for active acousto-ultrasonics-based SHM. The analysis of the wave field is based on velocity measurements using a laser Doppler vibrometer (LDV). New and established methods of PWAS inspection are explained in detail, listing advantages and disadvantages. The electro-mechanical impedance spectrum as basis for these methods is discussed for different sensor faults. This way this contribution focuses on a detailed analysis of PWAS and the need of their inspection for an increased reliability of SHM systems.
将压电薄膜有源传感器（PWAS）用于结构健康监测（SHM）目的，是基于声-超声方法的先进技术。为确保系统可靠性，有必要掌握有关PWAS本身的详细信息。本文概述了常见的PWAS故障，并介绍了这些故障对用于基于有源声-超声的SHM的波传播的影响。波场分析基于使用激光多普勒振动计（LDV）进行的速度测量。详细解释了新的和已有的PWAS检测方法，列出了优缺点。针对不同的传感器故障，讨论了作为这些方法基础的机电阻抗谱。通过这种方式，本文着重对PWAS进行详细分析，以及为提高SHM系统的可靠性而对其进行检测的必要性。
