Engelsen Daniel den, Fern George R, Harris Paul G, Ireland Terry G, Silver Jack
Centre for Phosphor and Display Materials, Wolfson Centre for Materials Processing, Brunel University London, Uxbridge, Middlesex UB8 3PH, UK.
Materials (Basel). 2017 Mar 17;10(3):312. doi: 10.3390/ma10030312.
Herein, we describe three advanced techniques for cathodoluminescence (CL) spectroscopy that have recently been developed in our laboratories. The first is a new method to accurately determine the CL-efficiency of thin layers of phosphor powders. When a wide band phosphor with a band gap (E > 5 eV) is bombarded with electrons, charging of the phosphor particles will occur, which eventually leads to erroneous results in the determination of the luminous efficacy. To overcome this problem of charging, a comparison method has been developed, which enables accurate measurement of the current density of the electron beam. The study of CL from phosphor specimens in a scanning electron microscope (SEM) is the second subject to be treated. A detailed description of a measuring method to determine the overall decay time of single phosphor crystals in a SEM without beam blanking is presented. The third technique is based on the unique combination of microscopy and spectrometry in the transmission electron microscope (TEM) of Brunel University London (UK). This combination enables the recording of CL-spectra of nanometre-sized specimens and determining spatial variations in CL emission across individual particles by superimposing the scanning TEM and CL-images.
在此,我们描述了最近在我们实验室中开发的三种用于阴极发光(CL)光谱学的先进技术。第一种是一种准确测定磷光体粉末薄层CL效率的新方法。当用电子轰击带隙(E>5 eV)的宽带磷光体时,磷光体颗粒会发生充电,这最终会导致发光效率测定结果出现误差。为了克服这种充电问题,已经开发出一种比较方法,该方法能够精确测量电子束的电流密度。在扫描电子显微镜(SEM)中研究磷光体标本的CL是要处理的第二个主题。本文详细描述了一种在不进行束消隐的情况下测定SEM中单个磷光体晶体整体衰减时间的测量方法。第三种技术基于英国伦敦布鲁内尔大学透射电子显微镜(TEM)中显微镜和光谱学的独特结合。这种结合能够记录纳米尺寸标本的CL光谱,并通过叠加扫描TEM图像和CL图像来确定单个颗粒上CL发射的空间变化。