Zhang Liang, Liu Zhi-Quan, Yang Fan, Zhong Su-Juan
School of Mechatronic Engineering, Jiangsu Normal University, Xuzhou 221116, China.
Institute of Metal Research, Chinese Academy of Science, Shenyang 110016, China.
Materials (Basel). 2017 Mar 23;10(4):327. doi: 10.3390/ma10040327.
Cu₆Sn₅ whiskers precipitated in Sn3.0Ag0.5Cu/Cu interconnection in concentrator silicon solar cells solder layer were found and investigated after reflow soldering and during aging. Ag₃Sn fibers can be observed around Cu₆Sn₅ whiskers in the matrix microstructure, which can play an active effect on the reliability of interconnection. Different morphologies of Cu₆Sn₅ whiskers can be observed, and hexagonal rod structure is the main morphology of Cu₆Sn₅ whiskers. A hollow structure can be observed in hexagonal Cu₆Sn₅ whiskers, and a screw dislocation mechanism was used to represent the Cu₆Sn₅ growth. Based on mechanical property testing and finite element simulation, Cu₆Sn₅ whiskers were regarded as having a negative effect on the durability of Sn3.0Ag0.5Cu/Cu interconnection in concentrator silicon solar cells solder layer.
在聚光硅太阳能电池焊料层的Sn3.0Ag0.5Cu/Cu互连中发现了Cu₆Sn₅晶须,并在回流焊接后和老化过程中对其进行了研究。在基体微观结构中,可以观察到Ag₃Sn纤维围绕在Cu₆Sn₅晶须周围,这对互连的可靠性可能起到积极作用。可以观察到Cu₆Sn₅晶须的不同形态,六方棒状结构是Cu₆Sn₅晶须的主要形态。在六方Cu₆Sn₅晶须中可以观察到中空结构,并采用螺位错机制来描述Cu₆Sn₅的生长。基于力学性能测试和有限元模拟,认为Cu₆Sn₅晶须对聚光硅太阳能电池焊料层中Sn3.0Ag0.5Cu/Cu互连的耐久性有负面影响。