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具有电沉积Sn-Zn合金薄膜的钎焊铜棒的力学性能

Mechanical Properties of Solder-Jointed Copper Rods with Electrodeposited Sn-Zn Alloy Films.

作者信息

Tsurusaki Tatsuya, Ohgai Takeshi

机构信息

Graduate School of Engineering, Nagasaki University, 1-14 Bunkyo-machi, Nagasaki 852-8521, Japan.

Faculty of Engineering, Nagasaki University, 1-14 Bunkyo-machi, Nagasaki 852-8521, Japan.

出版信息

Materials (Basel). 2020 Mar 14;13(6):1330. doi: 10.3390/ma13061330.

DOI:10.3390/ma13061330
PMID:32183363
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7142963/
Abstract

Enforced solid solution type Sn-Zn alloy films were electrochemically synthesized on Cu substrate from an aqueous solution containing citric acid complexes. The electrodeposition behavior of Sn-Zn alloys was classified to a normal co-deposition type, in which electrochemically nobler Sn deposits preferentially compared to Zn. Electrodeposited Sn-Zn alloy films were composed of a non-equilibrium phase, like an enforced solid solution, which was not observed in an equilibrium phase diagram of an Sn-Zn binary alloy system. By applying a thermal annealing process at 150 °C for 10 minutes, a pure Zn phase was precipitated from an electrodeposited Sn-based solid solution phase with excessively dissolved Zn atoms. During the soldering process, intermetallic phases such as CuSn and CuZn were formed at the interface between an Sn-Zn alloy and Cu substrate. Tensile strength and fracture elongation of solder-jointed Cu rods with Sn-8 at.%Zn alloy films reached ca. 40 MPa and 12%, respectively.

摘要

通过电化学方法,在含有柠檬酸络合物的水溶液中,于铜基底上合成了强制固溶体型Sn-Zn合金薄膜。Sn-Zn合金的电沉积行为属于正常共沉积类型,其中电化学性质较惰性的Sn比Zn更优先沉积。电沉积的Sn-Zn合金薄膜由非平衡相组成,类似于强制固溶体,这在Sn-Zn二元合金体系的平衡相图中并未观察到。通过在150℃下进行10分钟的热退火处理,从电沉积的含过量溶解Zn原子的Sn基固溶相中析出了纯Zn相。在焊接过程中,在Sn-Zn合金与铜基底的界面处形成了诸如CuSn和CuZn之类的金属间相。具有Sn-8原子%Zn合金薄膜的焊接铜棒的拉伸强度和断裂伸长率分别达到约40MPa和12%。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/59c346887168/materials-13-01330-g012.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/59c346887168/materials-13-01330-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/2414e180ce26/materials-13-01330-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/e0a220f285d0/materials-13-01330-g002.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/bcac0712113e/materials-13-01330-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/a4763539fd1c/materials-13-01330-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/2265eab5e18b/materials-13-01330-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/310b5cf0e1ed/materials-13-01330-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/2b1486667d75/materials-13-01330-g010.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0476/7142963/59c346887168/materials-13-01330-g012.jpg

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