Cheng Ji, Jiang Shengxiang, Zhang Yan, Yang Zhijian, Wang Cunda, Yu Tongjun, Zhang Guoyi
Research Center for Wide Gap Semiconductors, State Key Laboratory for Artificial Microstructure and Microscopic Physics, School of Physics, Peking University, Beijing 100871, China.
Institute of Condensed Matter Physics, School of Physics, Peking University, Beijing 100871, China.
Materials (Basel). 2017 May 2;10(5):483. doi: 10.3390/ma10050483.
The problem of weak magnetism has hindered the application of magnetic semiconductors since their invention, and on the other hand, the magnetic mechanism of GaN-based magnetic semiconductors has been the focus of long-standing debate. In this work, nanoscale GaN:Mn wires were grown on the top of GaN ridges by metalorganic chemical vapor deposition (MOCVD), and the superconducting quantum interference device (SQUID) magnetometer shows that its ferromagnetism is greatly enhanced. Secondary ion mass spectrometry (SIMS) and energy dispersive spectroscopy (EDS) reveal an obvious increase of Mn composition in the nanowire part, and transmission electron microscopy (TEM) and EDS mapping results further indicate the correlation between the abundant stacking faults (SFs) and high Mn doping. When further combined with the micro-Raman results, the magnetism in GaN:Mn might be related not only to Mn concentration, but also to some kinds of built-in defects introduced together with the Mn doping or the SFs.
自发明以来,弱磁性问题一直阻碍着磁性半导体的应用,另一方面,基于氮化镓的磁性半导体的磁机制一直是长期争论的焦点。在这项工作中,通过金属有机化学气相沉积(MOCVD)在氮化镓脊顶部生长了纳米级氮化镓:锰线,超导量子干涉装置(SQUID)磁力计表明其铁磁性大大增强。二次离子质谱(SIMS)和能量色散谱(EDS)揭示了纳米线部分锰成分的明显增加,透射电子显微镜(TEM)和EDS映射结果进一步表明了大量堆垛层错(SFs)与高锰掺杂之间的相关性。当进一步结合微拉曼结果时,氮化镓:锰中的磁性可能不仅与锰浓度有关,还与锰掺杂或堆垛层错一起引入的某些种类的内禀缺陷有关。