Aoki Kanna, Ishiguro Keita, Denokami Masaki, Tanahashi Yuya, Furusawa Kentaro, Sekine Norihiko, Adschiri Tadafumi, Fujii Minoru
Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe, Hyogo, 657-8501, Japan.
Frontier Research Laboratory, National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo, 184-8795, Japan.
Small. 2017 Sep;13(36). doi: 10.1002/smll.201701630. Epub 2017 Aug 14.
Although, varieties of micro- to nanoscale fabrication technologies have been invented and refined for silicon (Si) processing because Si is the basic material of integrated circuits, the layouts are based on layer-by-layer approaches, making it difficult to realize three-dimensional (3D) structures with complicated shapes normal to the planar surface (along the out-of-plane direction) of the wafers used. Here, a novel and direct Si-processing technology that enables to bend thin layers of Si surfaces into various 3D curved structures at the micrometer scale is introduced. This bending is achieved by porosifying a Si wafer surface using anodic oxidation and then performing conventional photolithography patterning and wet etching. The porosity gradient in the depth direction gives rise to a stress-internalized layer in which self-rolling action is induced via subsequent patterning and wet etching. A subsequent oxidation process further enhances the curvature deformation, leading to the formation of tubes, for example. The rolling directions can be controlled by 2D patterning of the porous Si layer, which is explained well from a structural dynamics perspective. This technology has a wide range of capabilities for realizing 3D structures on Si substrates, enabling new design possibilities for Si-based on-chip devices.
尽管由于硅(Si)是集成电路的基础材料,已经发明并改进了各种用于硅加工的微米到纳米级制造技术,但这些布局基于逐层方法,使得难以在所用晶圆的平面表面(沿平面外方向)垂直方向上实现具有复杂形状的三维(3D)结构。在此,介绍了一种新颖且直接的硅加工技术,该技术能够将硅表面的薄层弯曲成微米级的各种3D弯曲结构。这种弯曲是通过使用阳极氧化使硅晶圆表面多孔化,然后进行传统的光刻图案化和湿法蚀刻来实现的。深度方向上的孔隙率梯度产生了一个应力内化层,在该层中通过后续的图案化和湿法蚀刻诱导自滚动作用。随后的氧化过程进一步增强了曲率变形,例如导致形成管子。滚动方向可以通过多孔硅层的二维图案化来控制,这从结构动力学角度可以很好地解释。该技术在硅基板上实现3D结构方面具有广泛的能力,为基于硅的片上器件带来了新的设计可能性。