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使用聚合物光刻和湿化学蚀刻对垂直硅结构进行可控图案化

Controlled Patterning of Vertical Silicon Structures Using Polymer Lithography and Wet Chemical Etching.

作者信息

Kim Han-Jung, Lee Su-Han, Lee Jihye, Lee Eung-Sug, Choi Jun-Hyuk, Jung Joo-Yun, Jeong Jun-Ho, Choi Dae-Geun

出版信息

J Nanosci Nanotechnol. 2015 Jun;15(6):4522-9. doi: 10.1166/jnn.2015.9780.

Abstract

In order to improve their performance for various applications, a facile method for the wafer-scale fabrication of micro/nano-patterned vertical silicon (Si) structures such as silicon nanowires (SiNWs), silicon nanorods (SiNRs), and porous silicon (p-Si) was developed. The method is based on the combination of lithography techniques (photolithography, thermal nano-imprint lithography, nanosphere lithography) and wet chemical etching (electro-chemical etching, metal-assisted chemical etching) processes. Micro-patterned p-Si with various pore diameters from 30 nm to 1.2 um were fabricated via electro-chemical etching. Micro/nano-patterned Si microstructures, nanorods, and nanowires were also successfully fabricated by changing the thickness of the metal layer of 5 nm or 20 nm in the metal-assisted chemical etching process. This study also investigated the effect of the etching time and patterning on the etched SiNWs length. This method provides advantages of simplicity, speed, large-scale production, easy size and shape manipulation, and low cost.

摘要

为了提高其在各种应用中的性能,开发了一种用于晶圆级制造微/纳米图案化垂直硅(Si)结构(如硅纳米线(SiNWs)、硅纳米棒(SiNRs)和多孔硅(p-Si))的简便方法。该方法基于光刻技术(光刻、热纳米压印光刻、纳米球光刻)和湿化学蚀刻(电化学蚀刻、金属辅助化学蚀刻)工艺的结合。通过电化学蚀刻制备了孔径从30nm到1.2μm不等的微图案化p-Si。通过在金属辅助化学蚀刻过程中改变5nm或20nm金属层的厚度,也成功制备了微/纳米图案化的Si微结构、纳米棒和纳米线。本研究还研究了蚀刻时间和图案化对蚀刻SiNWs长度的影响。该方法具有简单、快速、大规模生产、易于尺寸和形状操控以及低成本等优点。

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