Shaikeea Angkur Jyoti Dipanka, Basu Saptarshi, Tyagi Abhishek, Sharma Saksham, Hans Rishabh, Bansal Lalit
Department of Engineering Science, University of Oxford, Oxford, United Kingdom.
Department of Mechanical Engineering, Indian Institute of Science, Bangalore, India.
PLoS One. 2017 Sep 15;12(9):e0184997. doi: 10.1371/journal.pone.0184997. eCollection 2017.
In this work, we provide a simple method to represent the contact line dynamics of an evaporating sessile droplet. As a droplet evaporates, two distinct contact line dynamics are observed. They are collectively known as modes of evaporation, namely Constant Contact Radius (CCR) and Constant Contact Angle (CCA). Another intermediate mode-Stick-Slide (SS) or mixed mode is also commonly observed. In this article, we are able to provide a graphical representation to these modes (named as MOE plot), which is visually more comprehensive especially for comparative studies. In addition, the method facilitates quantitative estimation for mode of evaporation (named as MOE fraction or MOEf), which doesn't exist in literature. Thus, various substrates can now be compared based on mode of evaporation (or contact line dynamics), which are governed by fluid property and surface characteristics.
在这项工作中,我们提供了一种简单的方法来描述蒸发的固着液滴的接触线动力学。随着液滴蒸发,会观察到两种不同的接触线动力学。它们统称为蒸发模式,即恒定接触半径(CCR)和恒定接触角(CCA)。另一种中间模式——粘滑(SS)或混合模式也很常见。在本文中,我们能够为这些模式提供一种图形表示(称为MOE图),从视觉上看它更全面,特别是对于比较研究。此外,该方法有助于对蒸发模式进行定量估计(称为MOE分数或MOEf),这在文献中是不存在的。因此,现在可以根据由流体性质和表面特性决定的蒸发模式(或接触线动力学)来比较各种基底。