Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon, 16419, Republic of Korea.
Department of Energy Science, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Adv Mater. 2017 Nov;29(44). doi: 10.1002/adma.201703363. Epub 2017 Sep 26.
Memristors such as phase-change memory and resistive memory have been proposed to emulate the synaptic activities in neuromorphic systems. However, the low reliability of these types of memories is their biggest challenge for commercialization. Here, a highly reliable memristor array using floating-gate memory operated by two terminals (source and drain) using van der Waals layered materials is demonstrated. Centimeter-scale samples (1.5 cm × 1.5 cm) of MoS as a channel and graphene as a trap layer grown by chemical vapor deposition (CVD) are used for array fabrication with Al O as the tunneling barrier. With regard to the memory characteristics, 93% of the devices exhibit an on/off ratio of over 10 with an average ratio of 10 . The high on/off ratio and reliable endurance in the devices allow stable 6-level memory applications. The devices also exhibit excellent memory durability over 8000 cycles with a negligible shift in the threshold voltage and on-current, which is a significant improvement over other types of memristors. In addition, the devices can be strained up to 1% by fabricating on a flexible substrate. This demonstration opens a practical route for next-generation electronics with CVD-grown van der Waals layered materials.
忆阻器,如相变存储器和电阻式存储器,已被提议用于模拟神经形态系统中的突触活动。然而,这些类型的存储器的低可靠性是它们商业化的最大挑战。在这里,展示了一种使用范德华层状材料通过两个终端(源极和漏极)操作的浮栅存储器的高可靠性忆阻器阵列。使用化学气相沉积(CVD)生长的 MoS 作为沟道和石墨烯作为俘获层的厘米级样品(1.5 cm×1.5 cm)用于具有 Al O 作为隧道势垒的阵列制造。关于存储特性,93%的器件表现出超过 10 的导通/关断比,平均比为 10 。器件的高导通/关断比和可靠的耐久性允许稳定的 6 级存储应用。该器件还表现出超过 8000 次循环的优异的存储耐久性,其阈值电压和导通电流几乎没有变化,这比其他类型的忆阻器有显著的改进。此外,通过在柔性衬底上制造,器件可以拉伸 1%。这项演示为使用 CVD 生长的范德华层状材料的下一代电子产品开辟了一条实用的途径。