College of Chemistry, Chemical Engineering and Materials Science, Soochow University, Soochow, People's Republic of China.
Nanotechnology. 2017 Nov 3;28(44):445501. doi: 10.1088/1361-6528/aa8585. Epub 2017 Oct 4.
The use of the van der Pauw (VDP) method for characterizing and evaluating the piezoresistive behavior of carbon nanomaterial enabled piezoresistive sensors have not been systematically studied. By using single-wall carbon nanotube (SWCNT) thin films as a model system, herein we report a coupled electrical-mechanical experimental study in conjunction with a multiphysics finite element simulation as well as an analytic analysis to compare the two-probe and VDP testing configuration in evaluating the piezoresistive behavior of carbon nanomaterial enabled piezoresistive sensors. The key features regarding the sample aspect ratio dependent piezoresistive sensitivity or gauge factor were identified for the VDP testing configuration. It was found that the VDP test configuration offers consistently higher piezoresistive sensitivity than the two-probe testing method.
范德堡（van der Pauw，VDP）方法在用于表征和评估碳纳米材料压阻式传感器的压阻行为方面的应用尚未得到系统研究。本文以单壁碳纳米管（SWCNT）薄膜作为模型体系，通过电-机械耦合实验研究，结合多物理场有限元模拟和解析分析，比较了两种探针和 VDP 测试配置在评估碳纳米材料压阻式传感器的压阻行为方面的差异。确定了 VDP 测试配置中与样品纵横比相关的压阻灵敏度或应变系数的关键特征。结果表明，VDP 测试配置比双探针测试方法具有更高的压阻灵敏度。
