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水在氢气还原 WO 薄膜中的作用:控制氧空位浓度,提高光电化学性能。

The role of water in reducing WO film by hydrogen: Controlling the concentration of oxygen vacancies and improving the photoelectrochemical performance.

机构信息

School of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China.

College of Resources and Environment, Hunan Agricultural University, Changsha 410128, China.

出版信息

J Colloid Interface Sci. 2018 Feb 15;512:86-95. doi: 10.1016/j.jcis.2017.10.039. Epub 2017 Oct 12.

Abstract

HO, as a product of reduced reaction by H, may affect the chemical equilibrium according to the changing of the pressure ratio of HO/H in the system. Meanwhile, the performance may also be influenced by adsorption of HO on the surface of the material. In this work, the effect of HO is studied by reducing plate-like array WO films under different pressure ratio of HO/H. It is controlled by changing the water temperature in the washing bottle through which the Ar/H (80:20) gas flows. The higher water vapor pressure not only decreases the content of W but also increases the content of surface hydroxyl groups in the WO films. Moreover, the excess water vapor improves the crystallinity. The WO film shows hydrophobicity with adhesive property and high contact angle hysteresis after reduction, and the wettability increases with the increase of the pressure ratio of HO/H. Additionally, a built-in electric field may form by dissociation of the surface hydroxyl group and absorption of O species, which promotes the charge separation, showing better photoelectrochemical (PEC) performance. Thus, water influences the coverage of chemical species on the surface of hydrogen reduced WO film, which affects the wettability and PEC performance.

摘要

HO 作为 H 还原的产物,可能会根据系统中 HO/H 的压力比的变化而影响化学平衡。同时,其性能也可能受到 HO 在材料表面吸附的影响。在这项工作中,通过在不同的 HO/H 压力比下还原板状 WO 薄膜来研究 HO 的影响。通过改变通过其流动的 Ar/H(80:20)气体的洗气瓶中的水温来控制。较高的水蒸气压力不仅降低了 W 的含量,而且增加了 WO 薄膜表面羟基的含量。此外,过量的水蒸气提高了结晶度。WO 薄膜在还原后表现出疏水性和粘性以及高接触角滞后,并且润湿性随 HO/H 压力比的增加而增加。此外,表面羟基的离解和 O 物种的吸附可能会形成内置电场,促进电荷分离,表现出更好的光电化学(PEC)性能。因此,水会影响氢还原 WO 薄膜表面化学物种的覆盖度,从而影响润湿性和 PEC 性能。

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