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羟基在 WO 和 WO(001)表面的吸附。

HO Adsorption on WO and WO (001) Surfaces.

机构信息

Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca , via R. Cozzi 55, 20125 Milano, Italy.

出版信息

ACS Appl Mater Interfaces. 2017 Jul 12;9(27):23212-23221. doi: 10.1021/acsami.7b06139. Epub 2017 Jun 28.

Abstract

The nature of the interaction of water with the WO surface is of crucial importance for the use of this semiconductor oxide in photocatalysis. In this work, we investigate water adsorption and dissociation on both clean and O-deficient (001) WO surfaces by means of an accurate DFT approach. The O vacancy formation energy (computed with respect to O) has been evaluated for all possible surface configurations, and the removal of the terminal O atom along the c axis is found to be preferred, costing about half the corresponding energy in the bulk. The presence of oxygen vacancies leads to a semiconductor to metal transition, confirming the experimental evidence of n-type conductivity in defective WO films. HO preferably adsorbs on WO in a molecular undissociated form, due to the presence of W ions at the surface that act as Lewis acid sites. This interaction, about -1 eV per HO molecule, is not very strong. Contrary to what is usually expected, the presence of oxygen vacancies does not significantly affect HO adsorption. Finally, we investigated the HO desorption from a hydroxylated surface. This suggests that the exposure of WO to H directly results in a hydroxylated surface and the corresponding HO desorption turns out to be a very efficient mechanism to generate a reduced oxide surface, with important consequences on the electronic structure of this oxide.

摘要

水与 WO 表面相互作用的性质对于这种半导体氧化物在光催化中的应用至关重要。在这项工作中,我们通过精确的 DFT 方法研究了清洁和 O 缺陷(001)WO 表面上水的吸附和离解。对于所有可能的表面构型,我们评估了 O 空位形成能(相对于 O 计算),并且发现沿着 c 轴去除末端 O 原子是优选的,其成本约为体相中相应能量的一半。氧空位的存在导致半导体向金属的转变,证实了实验证据表明在有缺陷的 WO 薄膜中存在 n 型导电性。HO 由于表面上存在 W 离子而作为路易斯酸位,优选以未离解的分子形式吸附在 WO 上。这种相互作用,每个 HO 分子约为-1 eV,不是很强。与通常预期的相反,氧空位的存在并没有显著影响 HO 的吸附。最后,我们研究了从羟基化表面解吸 HO。这表明 WO 暴露于 H 直接导致羟基化表面,并且相应的 HO 解吸是一种非常有效的生成还原氧化物表面的机制,这对这种氧化物的电子结构有重要影响。

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