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单层和少层磁性半导体 CrPS 的结构和光学性质

Structural and Optical Properties of Single- and Few-Layer Magnetic Semiconductor CrPS.

机构信息

School of Mechanical Engineering, Sungkyunkwan University , 2066 Seobu-ro, Jangan-gu, Suwon, Gyunggi-do 16419, South Korea.

Department of Chemistry, Pohang University of Science and Technology (POSTECH) , 50 Jigokro 127, Pohang, Gyeongbuk 37673, South Korea.

出版信息

ACS Nano. 2017 Nov 28;11(11):10935-10944. doi: 10.1021/acsnano.7b04679. Epub 2017 Oct 30.

Abstract

Atomically thin binary two-dimensional (2D) semiconductors exhibit diverse physical properties depending on their composition, structure, and thickness. By adding another element in these materials, which will lead to formation of ternary 2D materials, the property and structure would greatly change and significantly expanded applications could be explored. In this work, we report structural and optical properties of atomically thin chromium thiophosphate (CrPS), a ternary antiferromagnetic semiconductor. Its structural details were revealed by X-ray and electron diffraction. Transmission electron microscopy showed that preferentially cleaved edges are parallel to diagonal Cr atom rows, which readily identified their crystallographic orientations. Strong in-plane optical anisotropy induced birefringence that also enabled efficient determination of crystallographic orientation using polarized microscopy. The lattice vibrations were probed by Raman spectroscopy and exhibited significant dependence on thickness of crystals exfoliated down to a single layer. Optical absorption determined by reflectance contrast was dominated by d-d-type transitions localized at Cr ions, which was also responsible for the major photoluminescence peak at 1.31 eV. The spectral features in the absorption and emission spectra exhibited noticeable thickness dependence and hinted at a high photochemical activity for single-layer CrPS. The current structural and optical investigation will provide a firm basis for future study and application of this kind of atomically thin magnetic semiconductors.

摘要

原子层薄的二元二维(2D)半导体的物理性质取决于其组成、结构和厚度。通过在这些材料中添加另一种元素,形成三元 2D 材料,其性质和结构将发生很大的变化,可以探索出更广泛的应用。在这项工作中,我们报告了原子层薄的铬磷硫化物(CrPS)的结构和光学性质,它是一种三元反铁磁半导体。X 射线和电子衍射揭示了其结构细节。透射电子显微镜表明,优先劈开的边缘与对角线上的铬原子行平行,这很容易确定它们的晶体取向。强烈的面内光学各向异性引起双折射,也可以使用偏振显微镜有效地确定晶体取向。拉曼光谱探测到晶格振动,其厚度依赖性显著,晶体剥离至单层时尤为明显。由反射对比度确定的光吸收主要由位于 Cr 离子处的 d-d 型跃迁主导,这也是在 1.31 eV 处出现主要光致发光峰的原因。吸收和发射光谱中的光谱特征表现出明显的厚度依赖性,暗示了单层 CrPS 的高光化学活性。目前的结构和光学研究将为这种原子层薄的磁性半导体的未来研究和应用提供坚实的基础。

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