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气态电子学会议射频参考池中离子动能分布的研究

Studies of Ion Kinetic-Energy Distributions in the Gaseous Electronics Conference RF Reference Cell.

作者信息

Olthoff J K, Van Brunt R J, Radovanov S B

机构信息

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.

出版信息

J Res Natl Inst Stand Technol. 1995 Jul-Aug;100(4):383-400. doi: 10.6028/jres.100.029.

Abstract

A review is presented of kinetic-energy distribution measurements for ions striking grounded surfaces in a Gaseous Electronics Conference (GEC) rf Reference Cell. Two experimental arrangements that have been used to measure ion energies in the GEC Cell are described, and a comparison of their performance under different operating conditions is presented. Significant results from ion-energy analysis in the Reference Cell are highlighted, including evidence of effects due to surface conditions on ion sampling, verification of electrical behavior of the cell, inferences about ion-molecule reactions indicated by the shapes of measured ion kinetic-energy distributions (IEDs), and the use of measured IEDs for the validation of theoretical models. The paper concludes with a detailed study of IEDs measured for rf plasmas generated in mixtures of argon and oxygen, using both experimental arrangements.

摘要

本文综述了在气体电子学会议(GEC)射频参考池中离子撞击接地表面时动能分布的测量情况。描述了两种用于测量GEC池中离子能量的实验装置,并比较了它们在不同操作条件下的性能。重点介绍了参考池中离子能量分析的重要结果,包括表面条件对离子采样影响的证据、池的电学行为验证、由测量的离子动能分布(IED)形状所表明的离子-分子反应推断,以及使用测量的IED验证理论模型。本文最后详细研究了使用两种实验装置对氩气和氧气混合物中产生的射频等离子体测量的IED。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d2f7/4887239/5096d86dc856/j14ol2f1.jpg

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