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一种通过组合 X 射线光谱法和环境光谱技术对医疗器械进行可追溯污染分析的校准程序。

A calibration procedure for a traceable contamination analysis on medical devices by combined X-ray spectrometry and ambient spectroscopic techniques.

机构信息

Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany.

Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany.

出版信息

J Pharm Biomed Anal. 2018 Feb 20;150:308-317. doi: 10.1016/j.jpba.2017.12.007. Epub 2017 Dec 7.

Abstract

There is a strong need in the medical device industry to decrease failure rates of biomedical devices by reducing the incidence of defect structures and contaminants during the production process. The detection and identification of defect structures and contaminants is crucial for many industrial applications. The present study exploits reference-free X-ray fluorescence (XRF) analysis as an analytical tool for the traceable characterization of surface contaminants of medical devices, in particular N,N'-ethylene-bis (stearamide), an ubiquitous compound used in many industrial applications as a release agent or friction reduction additive. Reference-free XRF analysis as primary method has been proven to be capable of underpinning all other applied methods since it yields the absolute mass deposition of the selected N,N'-ethylene-bis (stearamide) contaminant whilst X-ray absorption fine structure analysis determines the chemical species. Ambient vibrational spectroscopy and mass spectroscopy methodologies such as Fourier transform infrared, Raman, and secondary ion mass spectroscopy have been used in this systematic procedure providing an extensive range of complementary analyses. The calibration procedure described in this paper was developed using specially designed and fabricated model systems varying in thickness and substrate material. Furthermore, typical real medical devices such as both a polyethylene hip liner and a silver-coated wound dressing have been contaminated and investigated by these diverse methods, enabling testing of this developed procedure. These well-characterized samples may be used as calibration standards for bench top instrumentation from the perspective of providing traceable analysis of biomaterials and surface treatments. These findings demonstrate the potential importance and usefulness of combining complementary methods for a better understanding of the relevant organic materials.

摘要

医疗器械行业强烈需要通过减少生产过程中缺陷结构和污染物的发生率来降低生物医学设备的故障率。缺陷结构和污染物的检测和识别对于许多工业应用至关重要。本研究利用无参考 X 射线荧光(XRF)分析作为一种分析工具,用于可追溯地表征医疗器械表面污染物,特别是 N,N'-乙撑双硬脂酰胺,这是一种在许多工业应用中用作脱模剂或减摩添加剂的普遍存在的化合物。无参考 XRF 分析作为主要方法已被证明能够支持所有其他应用方法,因为它可以得出选定的 N,N'-乙撑双硬脂酰胺污染物的绝对质量沉积,而 X 射线吸收精细结构分析则确定化学物质。环境振动光谱和质谱方法,如傅里叶变换红外、拉曼和二次离子质谱,已在本系统程序中使用,提供了广泛的补充分析。本文描述的校准程序是使用专门设计和制造的模型系统开发的,这些模型系统在厚度和基底材料上有所不同。此外,还使用典型的实际医疗器械,如聚乙烯髋关节衬垫和镀银伤口敷料进行了污染和研究,这些方法可用于测试这种已开发的程序。这些特征良好的样品可以用作台式仪器的校准标准,从提供生物材料和表面处理的可追溯分析的角度来看。这些发现表明,结合互补方法对于更好地理解相关有机材料具有重要意义和实用性。

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