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范德瓦尔斯外延生长在 InAs(111)上的 ZrTe 半金属中的无质量狄拉克费米子。

Massless Dirac Fermions in ZrTe Semimetal Grown on InAs(111) by van der Waals Epitaxy.

机构信息

National Center for Scientific Research "Demokritos" , 15310 Athens, Greece.

University Grenoble Alpes , 38400 Grenoble, France.

出版信息

ACS Nano. 2018 Feb 27;12(2):1696-1703. doi: 10.1021/acsnano.7b08350. Epub 2018 Jan 17.

Abstract

Single and few layers of the two-dimensional (2D) semimetal ZrTe are grown by molecular beam epitaxy on InAs(111)/Si(111) substrates. Excellent rotational commensurability, van der Waals gap at the interface and moiré pattern are observed indicating good registry between the ZrTe epilayer and the substrate through weak van der Waals forces. The electronic band structure imaged by angle resolved photoelectron spectroscopy shows that valence and conduction bands cross at the Fermi level exhibiting abrupt linear dispersions. The latter indicates massless Dirac Fermions which are maintained down to the 2D limit suggesting that single-layer ZrTe could be considered as the electronic analogue of graphene.

摘要

通过分子束外延在 InAs(111)/Si(111)衬底上生长出单层和少数几层二维(2D)半金属 ZrTe。观察到极好的旋转协调性、界面处的范德华间隙和莫尔图案,表明 ZrTe 外延层与衬底之间通过较弱的范德华力具有良好的配准。通过角分辨光电子能谱成像的电子能带结构表明,价带和导带在费米能级处相交,呈现出急剧的线性色散。后者表明存在无质量的狄拉克费米子,这些费米子一直维持到 2D 极限,这表明单层 ZrTe 可以被视为石墨烯的电子类似物。

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