Kaur Sumandeep, Kumar Ashok, Srivastava Sunita, Pandey Ravindra, Tankeshwar K
Department of Physics, Panjab University, Chandigarh 160014, India. Department of Physical Sciences, School of Basic and Applied Sciences, Central University of Punjab, Bathinda, 151001, India.
Nanotechnology. 2018 Apr 2;29(15):155701. doi: 10.1088/1361-6528/aaac43.
Few-layer black phosphorene has recently attracted significant interest in the scientific community. In this paper, we consider several polymorphs of phosphorene nanoribbons (PNRs) and employ deformation potential theory within the effective mass approximation, together with density functional theory, to investigate their structural, mechanical and electronic properties. The results show that the stability of a PNR strongly depends on the direction along which it can be cut from its 2D counterpart. PNRs also exhibit a wide range of line stiffnesses ranging from 6 × 10 eV m to 18 × 10 eV m, which has little dependence on the edge passivation. Likewise, the calculated electronic properties of PNRs show them to be either a narrow-gap semiconductor (E < 1 eV) or a wide-gap semiconductor (E > 1 eV). The carrier mobility of PNRs is found to be comparable to that of black phosphorene. Some of the PNRs show an n-type (p-type) semiconducting character owing to their higher electron (hole) mobility. Passivation of the edges leads to n-type ↔ p-type transition in many of the PNRs considered. The predicted novel characteristics of PNRs, with a wide range of mechanical and electronic properties, make them potentially suitable for use in nanoscale devices.
少层黑磷烯最近在科学界引起了极大的关注。在本文中,我们考虑了磷烯纳米带(PNR)的几种多晶型物,并在有效质量近似下采用形变势理论,结合密度泛函理论,来研究它们的结构、力学和电子性质。结果表明,PNR的稳定性强烈依赖于从其二维对应物上切割下来的方向。PNR还表现出范围广泛的线刚度,从6×10 eV/m到18×10 eV/m,这几乎与边缘钝化无关。同样,计算得到的PNR的电子性质表明它们要么是窄带隙半导体(E<1 eV),要么是宽带隙半导体(E>1 eV)。发现PNR的载流子迁移率与黑磷烯相当。一些PNR由于其较高的电子(空穴)迁移率而表现出n型(p型)半导体特性。边缘钝化导致许多所考虑的PNR中出现n型↔p型转变。PNR具有一系列新颖的力学和电子性质,这使得它们有可能适用于纳米级器件。