Jiang Kang, Lei Xinrui, Li Kuanguo, Lu Yonghua, Wang Pei
Opt Express. 2018 Feb 5;26(3):2380-2389. doi: 10.1364/OE.26.002380.
We combined confocal surface plasmon coupled emission microscopy (C-SPCEM) together with fluorescence emission difference (FED) technique to pursuit super-resolution fluorescent image. Solid or hollow point spread function (PSF) for C-SPCEM is achieved with radially-polarized or circularly-polarized illumination. The reason why PSF can be manipulated by the polarization of illumination light is corroborated by the interaction of fluorescent emitter with vector focal field on the plasmonic substrate. After introduction of FED technique, PSF for C-SPECM can shrunk to around λ/4 in full-width half-maximum, which is unambiguously beyond Rayleigh's diffraction limit. The super-resolution capability of C-SPCEM with FED technique is experimentally demonstrated by imaging aggregated fluorescent beads with 150 nm in diameter.
我们将共焦表面等离子体耦合发射显微镜（C-SPCEM）与荧光发射差异（FED）技术相结合，以追求超分辨率荧光图像。通过径向偏振或圆偏振照明实现了C-SPCEM的实心或空心点扩散函数（PSF）。荧光发射体与等离子体基底上的矢量焦场的相互作用证实了PSF可以通过照明光的偏振来操纵的原因。引入FED技术后，C-SPECM的PSF在半高宽处可缩小至约λ/4，这无疑超越了瑞利衍射极限。通过对直径为150 nm的聚集荧光珠进行成像，实验证明了C-SPCEM与FED技术的超分辨率能力。
