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由几何形状和外部场位置控制的向列型拓扑缺陷

Nematic topological defects positionally controlled by geometry and external fields.

作者信息

Kurioz Pavlo, Kralj Marko, Murray Bryce S, Rosenblatt Charles, Kralj Samo

机构信息

Jozef Stefan International Postgraduate School, Jamova 39 , 1000 Ljubljana, Slovenia.

Comtron, Trzaska 21, 2000 Maribor, Slovenia.

出版信息

Beilstein J Nanotechnol. 2018 Jan 10;9:109-118. doi: 10.3762/bjnano.9.13. eCollection 2018.

Abstract

Using a Landau-de Gennes approach, we study the impact of confinement topology, geometry and external fields on the spatial positioning of nematic topological defects (TDs). In quasi two-dimensional systems we demonstrate that a confinement-enforced total topological charge of > 1/2 decays into elementary TDs bearing a charge of = 1/2. These assemble close to the bounding substrate to enable essentially bulk-like uniform nematic ordering in the central part of a system. This effect is reminiscent of the Faraday cavity phenomenon in electrostatics. We observe that in certain confinement geometries, varying the correlation length size of the order parameter could trigger a global rotation of an assembly of TDs. Finally, we show that an external electric field could be used to drag the boojum fingertip towards the interior of the confinement cell. Assemblies of TDs could be exploited as traps for appropriate nanoparticles, opening several opportunities for the development of functional nanodevices.

摘要

采用朗道 - 德热纳方法,我们研究了限制拓扑结构、几何形状和外部场对向列型拓扑缺陷(TDs)空间定位的影响。在准二维系统中,我们证明,限制强制的总拓扑电荷大于1/2会衰变成电荷为1/2的基本TDs。这些TDs聚集在边界基底附近,从而在系统中心部分实现基本类似体相的均匀向列序。这种效应让人联想到静电学中的法拉第腔现象。我们观察到,在某些限制几何形状中,改变序参量的关联长度大小可能会引发TDs集合体的全局旋转。最后,我们表明,可以利用外部电场将布儒姆指尖拖向限制单元内部。TDs集合体可被用作合适纳米颗粒的陷阱,为功能性纳米器件的开发带来诸多机遇。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e72b/5789434/2ab994b91fb5/Beilstein_J_Nanotechnol-09-109-g002.jpg

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