Xu Linyan, Qian Shuangbei, Xie Yuan, Wu Enxiu, Hei Haicheng, Feng Zhihong, Wu Sen, Hu Xiaodong, Guo Tong, Zhang Daihua
Nanotechnology. 2018 Apr 27;29(17):175703. doi: 10.1088/1361-6528/aaaf97. Epub 2018 Feb 15.
Two-dimensional transition metal dichalcogenides have been widely applied to electronic and optoelectronic device owing to their remarkable material properties. Many studies present the platform for regulating the contact resistance via various doping schemes. Here, we report the alteration of mechanical properties of few top layers of the WSe flake which are processed by air stable n-doping of NO with a constant gas flow through mild plasma and present better manufacturability and friability. The single-line nanoscratching experiments on the WSe flakes with different doping time reveal that the manufacturable depths are positively correlated with the exposure time at a certain range and tend to be stable afterwards. Meanwhile, material characterization by x-ray photoelectron spectroscopy confirms that the alteration of mechanical properties is owing to the creation of Se vacancies and substitution of O atoms, which breaks the primary molecular structure of the WSe flakes. The synchronous Kelvin probe force microscopy and topography results of ROI nanoscratching of a stepped WSe sample confirmed that the depth of the degenerate doping is five layers, which was consistent with the single-line scratching experiments. Our results reveal the interrelationship of the mechanical property, chemical bonds and work function changes of the doped WSe flakes.
二维过渡金属二硫属化物因其卓越的材料性能而被广泛应用于电子和光电器件。许多研究提出了通过各种掺杂方案来调节接触电阻的平台。在此,我们报道了通过在温和等离子体中以恒定气流对WSe薄片的少数顶层进行空气稳定的n型NO掺杂处理后,其机械性能的改变,并且该处理具有更好的可制造性和易碎性。对不同掺杂时间的WSe薄片进行的单线纳米划痕实验表明,在一定范围内,可制造深度与暴露时间呈正相关,之后趋于稳定。同时,通过X射线光电子能谱进行的材料表征证实,机械性能的改变是由于Se空位的产生和O原子的取代,这破坏了WSe薄片的初级分子结构。对阶梯状WSe样品进行ROI纳米划痕的同步开尔文探针力显微镜和形貌结果证实,简并掺杂的深度为五层,这与单线划痕实验一致。我们的结果揭示了掺杂WSe薄片的机械性能、化学键和功函数变化之间的相互关系。