Kühnel Miguel R Carro-Temboury Martin, Ahmad Mariam, Andersen Frederik, Bech Ári Brend, Bendixen H Krestian L, Nawrocki Patrick R, Bloch Anders J, Bora Ilkay, Bukhari Tahreem A, Bærentsen Nicolai V, Carstensen Jens, Chima Smeeah, Colberg Helene, Dahm Rasmus T, Daniels Joshua A, Dinckan Nermin, Idrissi Mohamed El, Erlandsen Ricci, Førster Marc, Ghauri Yasmin, Gold Mikkel, Hansen Andreas, Hansen Kenn, Helmsøe-Zinck Mathias, Henriksen Mathias, Hoffmann Sophus V, Hyllested Louise O H, Jensen Casper, Kallenbach Amalie S, Kaur Kirandip, Khan Suheb R, Kjær Emil T S, Kristiansen Bjørn, Langvad Sylvester, Lund Philip M, Munk Chastine F, Møller Theis, Nehme Ola M Z, Nejrup Mathilde Rove, Nexø Louise, Nielsen Simon Skødt Holm, Niemeier Nicolai, Nikolajsen Lasse V, Nøhr Peter C T, Orlowski Dominik B, Overgaard Marc, Ovesen Jacob Skaarup, Paustian Lucas, Pedersen Adam S, Petersen Mathias K, Poulsen Camilla M, Praeger-Jahnsen Louis, Qureshi L Sonia, Ree Nicolai, Schiermacher Louise S, Simris Martin B, Smith Gorm, Smith Heidi N, Sonne Alexander K, Zenulovic Marko R, Sørensen Alma Winther, Sørensen Karina, Vogt Emil, Væring Andreas, Westermann Jonas, Özcan Sevin B, Sørensen Thomas Just
Nano-Science Center & Department of Chemistry, University of Copenhagen, Universitetsparken 5, 2100 København Ø, Denmark.
Nanomaterials (Basel). 2018 Feb 15;8(2):109. doi: 10.3390/nano8020109.
Three series of ionic self-assembled materials based on anionic azo-dyes and cationic benzalkonium surfactants were synthesized and thin films were prepared by spin-casting. These thin films appear isotropic when investigated with polarized optical microscopy, although they are highly anisotropic. Here, three series of homologous materials were studied to rationalize this observation. Investigating thin films of ordered molecular materials relies to a large extent on advanced experimental methods and large research infrastructure. A statement that in particular is true for thin films with nanoscopic order, where X-ray reflectometry, X-ray and neutron scattering, electron microscopy and atom force microscopy (AFM) has to be used to elucidate film morphology and the underlying molecular structure. Here, the thin films were investigated using AFM, optical microscopy and polarized absorption spectroscopy. It was shown that by using numerical method for treating the polarized absorption spectroscopy data, the molecular structure can be elucidated. Further, it was shown that polarized optical spectroscopy is a general tool that allows determination of the molecular order in thin films. Finally, it was found that full control of thermal history and rigorous control of the ionic self-assembly conditions are required to reproducibly make these materials of high nanoscopic order. Similarly, the conditions for spin-casting are shown to be determining for the overall thin film morphology, while molecular order is maintained.
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