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透明衬底上低损耗 Ag 薄膜和纳米结构的光学性质。

Optical Properties of Low-Loss Ag Films and Nanostructures on Transparent Substrates.

机构信息

Industrial Technology Center of Wakayama Prefecture , Ogura 60 , Wakayama , Wakayama 649-6261 , Japan.

Department of Electronics and Mechanics , Toba National College of Maritime Technology , Ikegami 1-1 , Toba , Mie 517-8501 , Japan.

出版信息

ACS Appl Mater Interfaces. 2018 Mar 7;10(9):8333-8340. doi: 10.1021/acsami.7b18367. Epub 2018 Feb 27.

Abstract

We demonstrate the fabrication of a low-loss single-crystalline Ag nanostructure deposited on transparent substrates. Our approach is based on an epitaxial growth technique in which a NaCl(001) substrate is used. The NaCl substrate is dissolved in water to allow the Ag film to be transferred onto the desired substrates. Focused ion beam milling is subsequently employed to pattern a nanoarray structure consisting of 200 nanorods. The epitaxial Ag films with nanoarray structures grown in the study exhibited very flat and smooth surfaces having excellent crystallinity and local misorientation of less than 1°. Further, spectroscopic ellipsometry measurements indicated that the imaginary part of the dielectric constant of the single-crystalline film was smaller than that of a conventional polycrystalline film. Moreover, we used the three-dimensional finite-difference time-domain method to analyze the plasmonic properties of the nanoarray structure by considering the actual processed structure. Characteristically, when the SiO substrate was etched by ion beam milling to a depth of 30 nm, the spectrum showed a spectral shape 20% sharper than that of the substrate with no etching (depth: 0 nm). The plasmonic performance of the single-crystalline Ag nanostructure was largely determined by its structural precision and the dielectric properties of the metal.

摘要

我们展示了在透明衬底上沉积的低损耗单晶 Ag 纳米结构的制造。我们的方法基于一种外延生长技术,其中使用 NaCl(001) 衬底。将 NaCl 衬底溶解在水中,以使 Ag 薄膜能够转移到所需的衬底上。然后采用聚焦离子束铣削技术对由 200 根纳米棒组成的纳米阵列结构进行图案化。在研究中生长的具有纳米阵列结构的外延 Ag 薄膜具有非常平坦和光滑的表面,具有优异的结晶度和局部取向小于 1°。此外,光谱椭圆测量表明,单晶薄膜的介电常数虚部小于常规多晶薄膜的介电常数虚部。此外,我们使用三维有限差分时域方法通过考虑实际加工结构来分析纳米阵列结构的等离子体特性。特征上,当通过离子束铣削将 SiO 衬底蚀刻到 30nm 的深度时,与未蚀刻(深度:0nm)的衬底相比,光谱显示出 20%更尖锐的光谱形状。单晶 Ag 纳米结构的等离子体性能主要取决于其结构精度和金属的介电性能。

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