Park Sung Min, Wang Bo, Das Saikat, Chae Seung Chul, Chung Jin-Seok, Yoon Jong-Gul, Chen Long-Qing, Yang Sang Mo, Noh Tae Won
Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, Korea.
Department of Physics and Astronomy, Seoul National University, Seoul, Korea.
Nat Nanotechnol. 2018 May;13(5):366-370. doi: 10.1038/s41565-018-0083-5. Epub 2018 Mar 12.
Flexoelectricity is an electromechanical coupling between electrical polarization and a strain gradient that enables mechanical manipulation of polarization without applying an electrical bias. Recently, flexoelectricity was directly demonstrated by mechanically switching the out-of-plane polarization of a uniaxial system with a scanning probe microscope tip. However, the successful application of flexoelectricity in low-symmetry multiaxial ferroelectrics and therefore active manipulation of multiple domains via flexoelectricity have not yet been achieved. Here, we demonstrate that the symmetry-breaking flexoelectricity offers a powerful route for the selective control of multiple domain switching pathways in multiaxial ferroelectric materials. Specifically, we use a trailing flexoelectric field that is created by the motion of a mechanically loaded scanning probe microscope tip. By controlling the SPM scan direction, we can deterministically select either stable 71° ferroelastic switching or 180° ferroelectric switching in a multiferroic magnetoelectric BiFeO thin film. Phase-field simulations reveal that the amplified in-plane trailing flexoelectric field is essential for this domain engineering. Moreover, we show that mechanically switched domains have a good retention property. This work opens a new avenue for the deterministic selection of nanoscale ferroelectric domains in low-symmetry materials for non-volatile magnetoelectric devices and multilevel data storage.
挠曲电效应是电极化与应变梯度之间的一种机电耦合,它能够在不施加电偏置的情况下对极化进行机械操控。最近,通过使用扫描探针显微镜尖端机械切换单轴系统的面外极化,挠曲电效应得到了直接证明。然而,挠曲电效应在低对称性多轴铁电体中的成功应用以及因此通过挠曲电效应实现对多个畴的主动操控尚未实现。在此,我们证明,对称性破缺的挠曲电效应为选择性控制多轴铁电材料中的多个畴切换路径提供了一条有力途径。具体而言,我们利用由机械加载的扫描探针显微镜尖端的运动产生的拖尾挠曲电场。通过控制扫描探针显微镜的扫描方向,我们可以在多铁性磁电BiFeO薄膜中确定性地选择稳定的71°铁弹性切换或180°铁电切换。相场模拟表明,放大的面内拖尾挠曲电场对于这种畴工程至关重要。此外,我们表明机械切换的畴具有良好的保留特性。这项工作为在低对称性材料中确定性选择纳米级铁电畴开辟了一条新途径,可用于非易失性磁电器件和多级数据存储。