Sassi Selma, Candolfi Christophe, Gendarme Christine, Dauscher Anne, Lenoir Bertrand
Institut Jean Lamour, UMR 7198 CNRS - Université de Lorraine, 2 allée André Guinier-Campus ARTEM, BP 50840, 54011 Nancy Cedex, France.
Dalton Trans. 2018 Mar 26;47(13):4714-4721. doi: 10.1039/c7dt04916a.
The crystal structure and transport properties (2-723 K) of the homologous compound Pb5Bi6Se14 with partial substitution of Te for Se are studied by means of powder X-ray diffraction, scanning electron microscopy, electrical resistivity, thermopower, thermal conductivity and Hall effect measurements. Polycrystalline samples of Pb5Bi6Se14-xTex (0 ≤ x ≤ 1.0) were prepared by a two-step synthesis method based on the pseudo-binary PbSe-Bi2Se3 phase diagram combined with Te substitution in the PbSe precursor. The successful insertion of Te into the crystal structure of Pb5Bi6Se14 was confirmed by powder X-ray diffraction and scanning electron microscopy. Transport property measurements indicate an increase in the heavily doped character of the transport with increasing the Te concentration. The extremely low lattice thermal conductivity values (0.3-0.4 W m-1 K-1 at 723 K) that approach the glassy limit at high temperatures are nearly independent of the chemical composition suggesting no influence on point-defect scattering mechanisms in the substituted compounds. Despite the inherent complexity of this system, the evolution of the electronic properties with x is well described by a simple single-parabolic band model. Because the increase in the power factor with increasing x is compensated by the concomitant increase in the electronic thermal conductivity, this substitution does not yield enhanced ZT values with respect to the pristine compound with a similar peak ZT value of 0.5 achieved at 723 K. Nevertheless, the simple synthetic method used in this study to insert a doping element opens new avenues for controlling the transport properties of the homologous series (PbSe)5(Bi2Se3)3m (m = 1, 2 and 3).
通过粉末X射线衍射、扫描电子显微镜、电阻率、热功率、热导率和霍尔效应测量等手段,研究了用Te部分替代Se的同系化合物Pb5Bi6Se14的晶体结构和输运性质(2 - 723 K)。基于伪二元PbSe - Bi2Se3相图并结合在PbSe前驱体中进行Te替代,采用两步合成法制备了Pb5Bi6Se14 - xTex(0 ≤ x ≤ 1.0)的多晶样品。粉末X射线衍射和扫描电子显微镜证实了Te成功插入到Pb5Bi6Se14的晶体结构中。输运性质测量表明,随着Te浓度的增加,输运的重掺杂特性增强。在高温下接近玻璃态极限的极低晶格热导率值(723 K时为0.3 - 0.4 W m-1 K-1)几乎与化学成分无关,这表明对替代化合物中的点缺陷散射机制没有影响。尽管该体系存在内在复杂性,但用简单的单抛物线带模型可以很好地描述电子性质随x的演变。由于随着x增加功率因数的增加被电子热导率的相应增加所补偿,相对于在723 K时达到类似峰值ZT值0.5的原始化合物,这种替代并没有产生更高的ZT值。然而,本研究中用于插入掺杂元素的简单合成方法为控制同系物系列(PbSe)5(Bi2Se3)3m(m = 1、2和3)的输运性质开辟了新途径。