Raventós M, Lehmann E H, Boin M, Morgano M, Hovind J, Harti R, Valsecchi J, Kaestner A, Carminati C, Boillat P, Trtik P, Schmid F, Siegwart M, Mannes D, Strobl M, Grünzweig C
Laboratory for Neutron Scattering and Imaging, Villigen, Switzerland.
University of Geneva, Geneva, Switzerland.
J Appl Crystallogr. 2018 Mar 1;51(Pt 2):386-394. doi: 10.1107/S1600576718001607. eCollection 2018 Apr 1.
The development of neutron imaging from a qualitative inspection tool towards a quantitative technique in materials science has increased the requirements for accuracy significantly. Quantifying the thickness or the density of polycrystalline samples with high accuracy using neutron imaging has two main problems: (i) the scattering from the sample creates artefacts on the image and (ii) there is a lack of specific reference attenuation coefficients. This work presents experimental and simulation results to explain and approach these problems. Firstly, a series of neutron radiography and tomography experiments of iron, copper and vanadium are performed and serve as a reference. These materials were selected because they attenuate neutrons mainly through coherent (Fe and Cu) and incoherent (V) scattering. Secondly, an Monte Carlo model was developed, based on beamline, sample and detector parameters, in order to simulate experiments, understand the physics involved and interpret the experimental data. The model, developed in the framework, uses information about the sample geometry and crystalline structure, as well as beamline settings, such as spectrum, geometry and detector type. The validity of the simulations is then verified with experimental results for the two problems that motivated this work: (i) the scattering distribution in transmission imaging and (ii) the calculated attenuation coefficients.
在材料科学领域,中子成像从一种定性检测工具发展成为一种定量技术,这显著提高了对精度的要求。使用中子成像高精度地量化多晶样品的厚度或密度存在两个主要问题:(i)样品的散射在图像上产生伪影;(ii)缺乏特定的参考衰减系数。这项工作展示了实验和模拟结果,以解释并解决这些问题。首先,进行了一系列铁、铜和钒的中子射线照相和断层扫描实验,并将其作为参考。选择这些材料是因为它们主要通过相干散射(铁和铜)和非相干散射(钒)来衰减中子。其次,基于束线、样品和探测器参数开发了一个蒙特卡罗模型,用于模拟实验、理解其中涉及的物理过程并解释实验数据。在该框架下开发的模型使用了有关样品几何形状和晶体结构的信息,以及束线设置,如光谱、几何形状和探测器类型。然后,针对引发这项工作的两个问题,用实验结果验证了模拟的有效性:(i)透射成像中的散射分布;(ii)计算得到的衰减系数。