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铌锡线的空洞形态与其在机械负载下不可逆临界电流退化之间的定量相关性。

Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading.

作者信息

Barth C, Seeber B, Rack A, Calzolaio C, Zhai Y, Matera D, Senatore C

机构信息

Department of Quantum Matter Physics (DQMP), University of Geneva, Geneva, Switzerland.

Department of Applied Physics (GAP), University of Geneva, Geneva, Switzerland.

出版信息

Sci Rep. 2018 Apr 26;8(1):6589. doi: 10.1038/s41598-018-24966-z.

DOI:10.1038/s41598-018-24966-z
PMID:29700359
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC5920112/
Abstract

Understanding the critical current performance variation of NbSn superconducting wires under mechanical loading is a crucial issue for the design of next generation accelerator and fusion magnets. In these applications, the mechanical properties of the conductors may become a limiting factor due to the strong electro-magnetic forces resulting from the combination of large magnets and intense magnetic fields. In particular, the presence of voids in the superconducting filament structure, which are formed during the fabrication and the reaction heat treatment, determines localized stress concentrations and possibly the formation of cracks. In this work, we demonstrate a quantitative correlation between the void morphology and the electro-mechanical limits measured on different Bronze route NbSn wires. Hot Isostatic Pressing (HIP) prior to the reaction heat treatment is utilized to partially eliminate the voids. The wires' void distributions - with and without HIP treatment - are detected and statistically analyzed using high energy X-ray micro tomography. The stress concentration due to the shape and distribution of the voids as well as their impact on the electro-mechanical properties are determined through finite element method modeling. Finally, the results are quantitatively correlated with the experimentally determined limits of the irreversible critical current degradation upon mechanical loading.

摘要

了解NbSn超导线在机械载荷下的临界电流性能变化是下一代加速器和聚变磁体设计中的关键问题。在这些应用中,由于大磁体和强磁场共同作用产生的强大电磁力,导体的机械性能可能成为限制因素。特别是,在制造和反应热处理过程中形成的超导细丝结构中的空隙的存在,决定了局部应力集中,并可能导致裂纹的形成。在这项工作中,我们展示了在不同青铜工艺NbSn导线上测量的空隙形态与机电极限之间的定量相关性。在反应热处理之前采用热等静压(HIP)来部分消除空隙。使用高能X射线显微断层扫描检测并统计分析经过和未经过HIP处理的导线的空隙分布。通过有限元方法建模确定由于空隙的形状和分布导致的应力集中及其对机电性能的影响。最后,将结果与实验确定的机械载荷下不可逆临界电流退化的极限进行定量关联。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/fe32abdb7bd9/41598_2018_24966_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/f0d1669e794d/41598_2018_24966_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/08a7a29d35ca/41598_2018_24966_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/ae2a3b48abce/41598_2018_24966_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/ebbc844d7ee0/41598_2018_24966_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/44e9cc448347/41598_2018_24966_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/fe32abdb7bd9/41598_2018_24966_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/f0d1669e794d/41598_2018_24966_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/08a7a29d35ca/41598_2018_24966_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/ae2a3b48abce/41598_2018_24966_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/ebbc844d7ee0/41598_2018_24966_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/44e9cc448347/41598_2018_24966_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/47a6/5920112/fe32abdb7bd9/41598_2018_24966_Fig6_HTML.jpg

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机器学习应用于X射线断层扫描,作为分析RRP NbSn导线中孔隙的一种新工具。
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On the mechanisms governing the critical current reduction in NbSn Rutherford cables under transverse stress.关于横向应力作用下NbSn卢瑟福电缆临界电流降低的控制机制
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