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用于低功耗、柔性、透明和宽光谱光响应光电探测器的相工程II型多金属硒化物异质结构

Phase-Engineered Type-II Multimetal-Selenide Heterostructures toward Low-Power Consumption, Flexible, Transparent, and Wide-Spectrum Photoresponse Photodetectors.

作者信息

Chen Yu-Ze, Wang Sheng-Wen, Su Teng-Yu, Lee Shao-Hsin, Chen Chia-Wei, Yang Chen-Hua, Wang Kuangye, Kuo Hao-Chung, Chueh Yu-Lun

机构信息

Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.

Department of Photonics and Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu, 30010, Taiwan.

出版信息

Small. 2018 May;14(22):e1704052. doi: 10.1002/smll.201704052. Epub 2018 Apr 30.

Abstract

Phase-engineered type-II metal-selenide heterostructures are demonstrated by directly selenizing indium-tin oxide to form multimetal selenides in a single step. The utilization of a plasma system to assist the selenization facilitates a low-temperature process, which results in large-area films with high uniformity. Compared to single-metal-selenide-based photodetectors, the multimetal-selenide photodetectors exhibit obviously improved performance, which can be attributed to the Schottky contact at the interface for tuning the carrier transport, as well as the type-II heterostructure that is beneficial for the separation of the electron-hole pairs. The multimetal-selenide photodetectors exhibit a response to light over a broad spectrum from UV to visible light with a high responsivity of 0.8 A W and an on/off current ratio of up to 10 . Interestingly, all-transparent photodetectors are successfully produced in this work. Moreover, the possibility of fabricating devices on flexible substrates is also demonstrated with sustainable performance, high strain tolerance, and high durability during bending tests.

摘要

通过直接硒化铟锡氧化物一步形成多金属硒化物,展示了相工程化的II型金属硒化物异质结构。利用等离子体系统辅助硒化促进了低温工艺,从而得到大面积且均匀性高的薄膜。与基于单金属硒化物的光电探测器相比,多金属硒化物光电探测器表现出明显改善的性能,这可归因于界面处用于调节载流子传输的肖特基接触,以及有利于电子 - 空穴对分离的II型异质结构。多金属硒化物光电探测器在从紫外到可见光的宽光谱范围内对光有响应,具有0.8 A/W的高响应度和高达10的开/关电流比。有趣的是,在这项工作中成功制备了全透明光电探测器。此外,还展示了在柔性基板上制造器件的可能性,在弯曲测试期间具有可持续的性能、高应变耐受性和高耐久性。

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