用于分析周围神经髓鞘的电子显微镜检查
Electron Microscopy for the Analysis of Peripheral Nerve Myelin.
作者信息
Ferri Cinzia, Quattrini Angelo, D'Antonio Maurizio
机构信息
Division of Genetics and Cell Biology, San Raffaele Scientific Institute, Milan, Italy.
Division of Neuroscience, San Raffaele Scientific Institute, Milan, Italy.
出版信息
Methods Mol Biol. 2018;1791:3-13. doi: 10.1007/978-1-4939-7862-5_1.
PMID:30006697
Abstract
Transmission electron microscopy (TEM) can provide excellent high-resolution images of cellular structures. A critical step with this technique is sample preparation. Here we describe our protocol for the preparation of semithin and ultrathin sections of mouse peripheral nerves in order to visualize the structure and pathological features of peripheral myelin with TEM.
摘要
透射电子显微镜（TEM）能够提供细胞结构的高分辨率图像。该技术的一个关键步骤是样品制备。在此，我们描述了制备小鼠外周神经半薄切片和超薄切片的方案，以便通过透射电子显微镜观察外周髓鞘的结构和病理特征。
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