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原位有髓轴突的光谱反射显微镜检查

Spectral Reflectometric Microscopy on Myelinated Axons In Situ.

作者信息

Kwon Junhwan, Choi Myunghwan

机构信息

Department of Biomedical Engineering, Sungkyunkwan University; Center for Neuroscience Imaging Research, Institute for Basic Science (IBS).

Department of Biomedical Engineering, Sungkyunkwan University; Center for Neuroscience Imaging Research, Institute for Basic Science (IBS);

出版信息

J Vis Exp. 2018 Jul 2(137):57965. doi: 10.3791/57965.

Abstract

In a mammalian nervous system, myelin provides an electrical insulation by enwrapping the axon fibers in a multilayered spiral. Inspired by its highly-organized subcellular architecture, we recently developed a new imaging modality, named spectral reflectometry (SpeRe), which enables unprecedented label-free nanoscale imaging of the live myelinated axons in situ. The underlying principle is to obtain nanostructural information by analyzing the reflectance spectrum of the multilayered subcellular structure. In this article, we describe a detailed step-by-step protocol for performing a basic SpeRe imaging of the nervous tissues using a commercial confocal microscopic system, equipped with a white-light laser and a tunable filter. We cover the procedures of sample preparation, acquisition of spectral data, and image processing for obtaining nanostructural information.

摘要

在哺乳动物的神经系统中,髓磷脂通过将轴突纤维包裹成多层螺旋结构来提供电绝缘。受其高度组织化的亚细胞结构启发,我们最近开发了一种名为光谱反射测量法(SpeRe)的新成像方式,它能够对活体内有髓轴突进行前所未有的无标记纳米级原位成像。其基本原理是通过分析多层亚细胞结构的反射光谱来获取纳米结构信息。在本文中,我们描述了一个详细的逐步方案,用于使用配备白光激光器和可调滤光片的商用共聚焦显微镜系统对神经组织进行基本的SpeRe成像。我们涵盖了样品制备、光谱数据采集以及获取纳米结构信息的图像处理过程。

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