Whelan Patrick R, Huang Deping, Mackenzie David, Messina Sara A, Li Zhancheng, Li Xin, Li Yunqing, Booth Timothy J, Jepsen Peter U, Shi Haofei, Bøggild Peter
Opt Express. 2018 Jul 9;26(14):17748-17754. doi: 10.1364/OE.26.017748.
Fast inline characterization of the electrical properties of graphene on polymeric substrates is an essential requirement for quality control in industrial graphene production. Here we show that it is possible to measure the sheet conductivity of graphene on polymer films by terahertz time-domain spectroscopy (THz-TDS) when all internally reflected echoes in the substrate are taken into consideration. The conductivity measured by THz-TDS is comparable to values obtained from four point probe measurements. THz-TDS maps of 25x30 cm area graphene films were recorded and the DC conductivity and carrier scattering time were extracted from the measurements. Additionally, the THz-TDS conductivity maps highlight tears and holes in the graphene film, which are not easily visible by optical inspection.
快速在线表征聚合物基底上石墨烯的电学性质是工业石墨烯生产中质量控制的一项基本要求。在此我们表明,当考虑基底中所有内反射回波时,通过太赫兹时域光谱(THz - TDS)可以测量聚合物薄膜上石墨烯的面电导率。用THz - TDS测量的电导率与四点探针测量得到的值相当。记录了面积为25×30平方厘米的石墨烯薄膜的THz - TDS图谱,并从测量中提取了直流电导率和载流子散射时间。此外,THz - TDS电导率图谱突出显示了石墨烯薄膜中的撕裂和孔洞,而这些通过光学检查不容易看到。