Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Bredesen Center for Interdisciplinary Research and Graduate Education, University of Tennessee, Knoxville, Tennessee 37996, USA.
Phys Rev Lett. 2018 Aug 24;121(8):086101. doi: 10.1103/PhysRevLett.121.086101.
Two-dimensional materials such as layered transition-metal dichalcogenides (TMDs) are ideal platforms for studying defect behaviors, an essential step towards defect engineering for novel material functions. Here, we image the 3D lattice locations of selenium-vacancy V_{Se} defects and manipulate them using a scanning tunneling microscope (STM) near the surface of PdSe_{2}, a recently discovered pentagonal layered TMD. The V_{Se} show a characterisitc charging ring in a spatially resolved conductance map, based on which we can determine its subsurface lattice location precisely. Using the STM tip, not only can we reversibly switch the defect states between charge neutral and charge negative, but also trigger migrations of V_{Se} defects. This allows a demonstration of direct "writing" and "erasing" of atomic defects and tracing the diffusion pathways. First-principles calculations reveal a small diffusion barrier of V_{Se} in PdSe_{2}, which is much lower than S vacancy in MoS_{2} or an O vacancy in TiO_{2}. This finding opens an opportunity of defect engineering in PdSe_{2} for such as controlled phase transformations and resistive-switching memory device application.
二维材料,如层状过渡金属二卤化物(TMDs),是研究缺陷行为的理想平台,这是实现新型材料功能的缺陷工程的重要步骤。在这里,我们通过扫描隧道显微镜(STM)在 PdSe_{2}表面附近对硒空位 V_{Se}缺陷的 3D 晶格位置进行成像,并对其进行操作。PdSe_{2}是一种最近发现的五边形层状 TMD。V_{Se}在空间分辨电导图中显示出特征的充电环,据此我们可以精确确定其亚表面晶格位置。通过 STM 针尖,不仅可以在带电荷和不带电荷之间可逆地切换缺陷状态,还可以触发 V_{Se}缺陷的迁移。这允许直接“写入”和“擦除”原子缺陷,并追踪扩散途径。第一性原理计算揭示了 V_{Se}在 PdSe_{2}中的小扩散势垒,远低于 MoS_{2}中的 S 空位或 TiO_{2}中的 O 空位。这一发现为 PdSe_{2}中的缺陷工程提供了机会,例如控制相转变和电阻开关存储器件的应用。