Lee Seung-Jae, Jeon Seong-Ran, Ju Jin-Woo, Baek Jong Hyeob, Su Jie, Lee Soo Min, Lee Dong S, Lee Cheul-Ro
Korea Photonics Technology Institute, Gwangju 61007, Republic of Korea.
Veeco Instruments Inc., Somerset, NJ 08873, USA.
J Nanosci Nanotechnol. 2019 Feb 1;19(2):892-896. doi: 10.1166/jnn.2019.15969.
The effects of Al metal pre-deposition under different conditions on GaN grown on Si(111) substrates by metal-organic chemical vapor deposition (MOCVD) have been investigated. Al pre-deposition improves surface morphology and crystal quality of GaN grown on Si. The surface morphology of Al pre-deposition layer, AlN, and GaN vary depending on Al pre-deposition temperature. With the increase of Al pre-deposition temperature, Al cluster size is observed to increase in the Al predeposition layer due to increased lateral mobility of Al atoms. The Al pre-deposition carried out at about 750 °C enables to grow pit-free GaN layer on Si(111) substrate.
研究了不同条件下Al金属预沉积对通过金属有机化学气相沉积(MOCVD)在Si(111)衬底上生长的GaN的影响。Al预沉积改善了在Si上生长的GaN的表面形貌和晶体质量。Al预沉积层、AlN和GaN的表面形貌随Al预沉积温度而变化。随着Al预沉积温度的升高,由于Al原子横向迁移率的增加,观察到Al预沉积层中的Al团簇尺寸增大。在约750℃下进行的Al预沉积能够在Si(111)衬底上生长无坑的GaN层。