Yamazaki H, Delgado-Aparicio L F, Groebner R, Grierson B, Hill K, Pablant N, Stratton B, Efthimion P, Ejiri A, Takase Y, Ono M
The University of Tokyo, Kashiwa 277-8561, Japan.
Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA.
Rev Sci Instrum. 2018 Oct;89(10):10G120. doi: 10.1063/1.5038788.
A new tool has been developed to calculate the spectral, spatial, and temporal responses of multi-energy soft x-ray (ME-SXR) pinhole cameras for arbitrary plasma densities ( ), temperature ( ), and impurity densities ( ). ME-SXR imaging provides a unique opportunity for obtaining important plasma properties (e.g., , , and ) by measuring both continuum and line emission in multiple energy ranges. This technique employs a pixelated x-ray detector in which the lower energy threshold for photon detection can be adjusted independently. Simulations assuming a tangential geometry and DIII-D-like plasmas (e.g., ≈ 8 × 10 m and ≈ 2.8 keV) for various impurity (e.g., C, O, Ar, Ni, and Mo) density profiles have been performed. The computed brightnesses range from few 10 counts pixel ms depending on the cut-off energy thresholds, while the maximum allowable count rate is 10 counts pixel ms. The typical spatial resolution in the mid-plane is ≈0.5 cm with a photon-energy resolution of 500 eV at a 500 Hz frame rate.
